MemoryMamba: Memory-Augmented State Space Model for Defect Recognition

Qianning Wang,He Hu,Yucheng Zhou
2024-05-07
Abstract:As automation advances in manufacturing, the demand for precise and sophisticated defect detection technologies grows. Existing vision models for defect recognition methods are insufficient for handling the complexities and variations of defects in contemporary manufacturing settings. These models especially struggle in scenarios involving limited or imbalanced defect data. In this work, we introduce MemoryMamba, a novel memory-augmented state space model (SSM), designed to overcome the limitations of existing defect recognition models. MemoryMamba integrates the state space model with the memory augmentation mechanism, enabling the system to maintain and retrieve essential defect-specific information in training. Its architecture is designed to capture dependencies and intricate defect characteristics, which are crucial for effective defect detection. In the experiments, MemoryMamba was evaluated across four industrial datasets with diverse defect types and complexities. The model consistently outperformed other methods, demonstrating its capability to adapt to various defect recognition scenarios.
Computer Vision and Pattern Recognition,Artificial Intelligence
What problem does this paper attempt to address?
### Problems the Paper Attempts to Solve This paper aims to address the challenges faced by defect detection technology in the current manufacturing environment. Specifically, existing visual models perform inadequately when dealing with complex and variable defects, especially in situations where data is limited or imbalanced. These issues are particularly pronounced in specific industrial scenarios because these models typically rely on large amounts of labeled data to achieve high performance, which is often difficult to obtain in real-world environments. To tackle these problems, the authors propose a novel memory-augmented state space model (Memory-Augmented State Space Model, SSM) named **MemoryMamba**. MemoryMamba combines state space models with memory augmentation mechanisms, effectively capturing and retaining critical defect information, thereby improving the accuracy and robustness of defect detection. The model has been evaluated on multiple industrial datasets and has demonstrated superior performance compared to existing methods.