Deep Metric Learning-Based Out-of-Distribution Detection with Synthetic Outlier Exposure

Assefa Seyoum Wahd
2024-05-02
Abstract:In this paper, we present a novel approach that combines deep metric learning and synthetic data generation using diffusion models for out-of-distribution (OOD) detection. One popular approach for OOD detection is outlier exposure, where models are trained using a mixture of in-distribution (ID) samples and ``seen" OOD samples. For the OOD samples, the model is trained to minimize the KL divergence between the output probability and the uniform distribution while correctly classifying the in-distribution (ID) data. In this paper, we propose a label-mixup approach to generate synthetic OOD data using Denoising Diffusion Probabilistic Models (DDPMs). Additionally, we explore recent advancements in metric learning to train our models.
Computer Vision and Pattern Recognition
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