Measuring the refractive index and thickness of multilayer samples by Fourier domain optical coherence tomography

Yu-Lin Ku,Yao-Gen Shu

2024-04-18

Abstract:Non-contact measurement of the refractive index and thickness of multilayer biological tissues is of great significance for biomedical applications and can greatly improve medical diagnosis and treatment. In this work, we introduce a theoretical method to simultaneously extract the above information using a Fourier domain optical coherence tomography (FD-OCT) system, in which no additional arrangement and prior information about the object is required other than the OCT interference spectrum. The single reflection components can be extracted from the observed spectrum by isolating the primary spikes in the sample reflectance profile, and then the refractive index and thickness can be obtained by fitting the actual and modeled values of the single reflection spectrum. In a two-layer sample example, the simulation results show that our method can reconstruct the results with high accuracy. The relative error is within 0.01%. The complexity of our approach grows linearly with the number of sample layers, making it well-adapted to multilayer situations. Our method takes into account both single and multiple reflections in multilayer samples and is therefore equally applicable to samples with high refractive index contrast.

Optics

What problem does this paper attempt to address?

This paper mainly discusses how to use Fourier domain optical coherence tomography (FD-OCT) technology to non-contactly measure the refractive index and thickness of multi-layered biological tissues, which is crucial for biomedical applications and medical diagnosis. Traditional OCT can only obtain reflectance profiles of optical path length variations, while the new method does not require additional sample information and can extract single and multiple reflection information by analyzing FD-OCT interference spectra.

In the new method, the refractive index and thickness are determined by separating the main peaks of the sample reflectance profiles and fitting them with actual and simulated single reflection spectra. The research indicates that this method is also applicable to samples with high refractive index contrast. By numerically simulating a two-layer sample, it has been demonstrated that the method can reconstruct the results with high accuracy, with a relative error less than 0.01%. In addition, the complexity of this method increases linearly with the number of sample layers, making it suitable for dealing with multi-layer situations.

The paper introduces the theoretical framework and method, including the steps of extracting refractive index and thickness from FD-OCT spectra, such as inverse Fourier transform, separation of major peaks, conversion to wavenumber space, and parameter fitting using Monte Carlo methods. The experimental results demonstrate that refractive index and thickness can be accurately measured even in situations with high refractive index contrast, with extremely small relative errors.

In summary, this paper proposes a new theoretical method for simultaneously measuring the refractive index and thickness of multi-layer samples using FD-OCT systems, with high accuracy and adaptability.