Abstract:Exciton-plasmon polaritons (EPPs) are attractive both for the exploration of fundamental phenomena and applications in nanophotonics. Previous studies of EPPs mainly relied on far-field characterization. Here, using near-field optical microscopy, we quantitatively characterize the dispersion of EPPs existing in 13-nm-thick tungsten diselenide (WSe$_2$) deposited on a monocrystalline gold platelet. We extract from our experimental data a Rabi splitting of 81 meV, and an experimental effective polariton loss of 55 meV, demonstrating that our system is in the strong-coupling regime. Furthermore, we measure for the first time at visible wavelengths the propagation length of these EPPs for each excitation energy of the dispersion relation. To demonstrate the quantitative nature of our near-field method to obtain the full complex-valued wavevector of EPPs, we use our near-field measurements to predict, via the transfer matrix method, the far-field reflectivities across the exciton resonance. These predictions are in excellent agreement with our experimental far-field measurements. Our findings open the door towards the full near-field study of light-manipulating devices at the nanoscale.

What problem does this paper attempt to address?

The paper attempts to address the problem of fully quantitative near-field characterization of strongly coupled exciton-plasmon polaritons (EPPs) in the visible to near-infrared wavelength range. Specifically, the researchers utilized scattering-type scanning near-field optical microscopy (s-SNOM) to conduct detailed near-field measurements of EPPs in a 13 nm thick tungsten diselenide (WSe₂) deposited on a single-crystal gold substrate, extracting key parameters such as dispersion relation, propagation length, and effective loss. ### Main Issues 1. **Fully Quantitative Near-Field Characterization**: - Previous studies mainly relied on far-field characterization, whereas this paper achieved fully quantitative characterization of EPPs using near-field optical microscopy techniques. - For the first time, the researchers measured the propagation length of EPPs in the visible wavelength range and extracted the Rabi splitting energy and effective loss of polaritons from experimental data. 2. **Verification of Strong Coupling Mechanism**: - Through experimental data, the researchers verified that the system is in the strong coupling regime, where the coupling strength between excitons and surface plasmons is high enough to form new hybrid states (EPPs). - The experimentally measured Rabi splitting energy is 81 meV, and the polariton loss is 55 meV, indicating that the system is indeed in a strong coupling state. 3. **Influence of Material Properties**: - The researchers explored the impact of the substrate (single-crystal gold) on the in-plane dielectric constant of the WSe₂ thin layer, finding that the presence of the substrate significantly altered the dielectric properties of WSe₂. - The dielectric function obtained from near-field measurements was compared with far-field measurement results, validating the effectiveness of the near-field method. ### Research Significance - **Technological Advancement**: This study demonstrates the capability of s-SNOM technology for fully quantitative characterization of light-matter interactions at the nanoscale, advancing the development of near-field optical microscopy techniques. - **Application Prospects**: Detailed characterization of EPPs provides important foundational data for future applications in fields such as nanolasers and quantum information processing. - **Theoretical Validation**: The consistency between experimental results and theoretical calculations validates the correctness of the strong coupling theory, providing experimental evidence for understanding the physical properties of strongly coupled systems. In summary, this paper, through advanced near-field optical microscopy techniques, achieved the first fully quantitative characterization of strongly coupled EPPs in the visible to near-infrared wavelength range, providing important references and data support for research in related fields.

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