On machine learning analysis of atomic force microscopy images for image classification, sample surface recognition

Igor Sokolov

2024-03-25

Abstract:Atomic force microscopy (AFM or SPM) imaging is one of the best matches with machine learning (ML) analysis among microscopy techniques. The digital format of AFM images allows for direct utilization in ML algorithms without the need for additional processing. Additionally, AFM enables the simultaneous imaging of distributions of over a dozen different physicochemical properties of sample surfaces, a process known as multidimensional imaging. While this wealth of information can be challenging to analyze using traditional methods, ML provides a seamless approach to this task. However, the relatively slow speed of AFM imaging poses a challenge in applying deep learning methods broadly used in image recognition. This Prospective is focused on ML recognition/classification when using a relatively small number of AFM images, small database. We discuss ML methods other than popular deep-learning neural networks. The described approach has already been successfully used to analyze and classify the surfaces of biological cells. It can be applied to recognize medical images, specific material processing, in forensic studies, even to identify the authenticity of arts. A general template for ML analysis specific to AFM is suggested, with a specific example of the identification of cell phenotype. Special attention is given to the analysis of the statistical significance of the obtained results, an important feature that is often overlooked in papers dealing with machine learning. A simple method for finding statistical significance is also described.

Biological Physics,Artificial Intelligence,Instrumentation and Detectors,Medical Physics

What problem does this paper attempt to address?

The problem that this paper attempts to solve is the challenges faced when applying machine learning (ML) methods for image classification and sample surface recognition in atomic force microscopy (AFM) image analysis. Specifically, the paper focuses on applying non - deep - learning machine learning methods on relatively small AFM image databases to achieve efficient and accurate image classification. The paper points out that although AFM provides rich multi - dimensional imaging information, its slow imaging speed limits the ability to generate a large number of images, which makes traditional deep - learning methods (such as convolutional neural network CNN) difficult to be widely applied. Therefore, the paper explores how to use non - deep - learning methods to overcome this limitation and provides a simple method for evaluating the statistical significance of classification results.

The main contributions of the paper are as follows:
1. **Proposing a machine learning method suitable for small - scale AFM image databases**: The paper describes in detail the complete process from selecting appropriate imaging channels to data pre - processing, feature extraction, model training and testing.
2. **Emphasizing the evaluation of the statistical significance of results**: The paper proposes a method to detect over - fitting by randomizing class labels and evaluates the statistical significance of classification results.
3. **Providing specific cell classification cases**: Through a practical cell classification example, the effectiveness of the proposed machine learning method is demonstrated.

In conclusion, the paper aims to provide researchers with a practical framework for applying machine learning methods in AFM image analysis, especially in the case of limited data.