Abstract:Far-field super-resolution imaging techniques such as stimulated emission depletion (STED), stochastic optical reconstruction microscopy (STORM), and photoactivation localization microscopy (PALM) etc., have enabled fluorescence labeled nanoscale imaging and analysis. However, it is necessary or preferable to develop label-free high resolution imaging techniques to avoid the problems of phototoxicity with live cells and moreover, for many non-biological applications where fluorescent labelling is simply not feasible. Recently, by capturing the exponentially decaying evanescent waves and propagating it to far field, novel imaging technique like hyperlens and microsphere contacting technologies, micro-fiber and nanowire illumination technology have brought new opportunities to label-free super resolution imaging, but still suffer from weak signal compared to background noise. On the other hand, there is lack of criteria reported to quantify the imaging quality of label free far-field nanoscopy, that will slow down the developing of label-free far-field nanoscopy. We introduce CNR first to label-free far-field nanoscopy to quantify the imaging performance and investigate the key influencing elements systematically. In our study, we investigated and analyzed the key elements to achieve high CNR label-free wide-field far-field sub-diffraction imaging. By optimizing the key factors including polarization, materials, as well as fabrication conditions, sub-diffraction imaging with resolution of 122 nm in a large FOV has been achieved experimentally. This work has provided an efficient and convenient way to realize high contrast wide-field far-field label-free super-resolution based on evanescent wave illumination.

Defocus-integration Interferometric Scattering Microscopy for Speckle Suppression and Enhancing Nanoparticle Detection on Substrate

Defocus-integration interferometric scattering microscopy for speckle suppression and enhancing nanoparticle detection on a substrate

High Contrast Wide-Field Evanescent Wave Illuminated Sub-Diffraction Imaging (conference Presentation)

Chip-compatible wide-field 3D nanoscopy through tunable spatial frequency shift effect

Multiscale Modeling and Analysis for High-fidelity Interferometric Scattering Microscopy

Resonant Scattering Enhanced Interferometric Scattering Microscopy

Resolving proximal nanometer objects below the diffraction limit with interferometric phase intensity nanoscopy

Non-invasive Optical Focusing Inside Strongly Scattering Media with Linear Fluorescence

Tracking Interfacial Dynamics of a Single Nanoparticle Using Plasmonic Scattering Interferometry

Identification of Nanoparticles Via Plasmonic Scattering Interferometry.

Focusing Through Scattering Media Via 1D Speckle Signal Feedback

Optofluidic restricted imaging, spectroscopy and counting of nanoparticles by evanescent wave using immiscible liquids

The point spread function in interferometric scattering microscopy (iSCAT). I. Aberrations in defocusing and axial localization

Depth-Resolved Imaging Through Dynamic Scattering Media Via Speckle Cross-Correlation under Near-Infrared Illumination

Directly and instantly seeing through random diffusers by self-imaging in scattering speckles

Circumventing the optical diffraction limit with customized speckles

Optimizing the nanoscale quantitative optical imaging of subfield scattering targets.

Wide-field Optical Sizing of Single Nanoparticles with 10 Nm Accuracy

Extended Depth-Resolved Imaging Through a Thin Scattering Medium with PSF Manipulation

Invited Article: Saturation scattering competition for non fluorescence single wavelength super resolution imaging

On-chip light-scattering enhancement enables high performance single-particle tracking under conventional bright-field microscope