Abstract:The synthesis of many new complex oxides involves topotactic reduction—a process used to alter electronic structure through the removal of specific oxygen ions. The reaction can be damaging to the crystal lattice, however, and little is known about the reduction process in ultrathin films. Li et al. observed the reaction in situ using synchrotron X‐ray methods to probe formation of the superconducting nickelate, Nd0.8 Sr0.2NiO2, providing key insights into the nature of the phase transition. Topotactic reduction is critical to a wealth of phase transitions of current interest, including synthesis of the superconducting nickelate Nd0.8Sr0.2NiO2, reduced from the initial Nd0.8Sr0.2NiO3/SrTiO3 heterostructure. Due to the highly sensitive and often damaging nature of the topotactic reduction, however, only a handful of research groups have been able to reproduce the superconductivity results. A series of in situ synchrotron‐based investigations reveal that this is due to the necessary formation of an initial, ultrathin layer at the Nd0.8Sr0.2NiO3 surface that helps to mediate the introduction of hydrogen into the film such that apical oxygens are first removed from the Nd0.8Sr0.2NiO3 / SrTiO3 (001) interface and delivered into the reducing environment. This allows the square‐planar / perovskite interface to stabilize and propagate from the bottom to the top of the film without the formation of interphase defects. Importantly, neither geometric rotations in the square planar structure nor significant incorporation of hydrogen within the films is detected, obviating its need for superconductivity. These findings unveil the structural basis underlying the transformation pathway and provide important guidance on achieving the superconducting phase in reduced nickelate systems.

Synthesis of thin film infinite-layer nickelates by atomic hydrogen reduction: clarifying the role of the capping layer

Synthesis of infinite-layer nickelates and influence of the capping-layer on magnetotransport

Resolving the polar interface of infinite-layer nickelate thin films

${\mathrm{\textit{In situ}}}$ preparation of superconducting infinite-layer nickelate thin films with atomically flat surface

On the Topotactic Phase Transition Achieving Superconducting Infinite‐Layer Nickelates

Aspects of the synthesis of thin film superconducting infinite-layer nickelates

Preparation of superconducting thin films of infinite-layer nickelate Nd$_{0.8}$Sr$_{0.2}$NiO$_{2}$

Towards reliable synthesis of superconducting infinite layer nickelate thin films by topochemical reduction

Scanning tunnelling microscopy and X-ray photoemission studies of NdNiO2 infinite-layer nickelates films

Origin of a Topotactic Reduction Effect for Superconductivity in Infinite-Layer Nickelates

On the origin of topotactic reduction effect for superconductivity in infinite-layer nickelates

Preparation of Superconducting Thin Films of Infinite-Layer Nickelate Nd0.8Sr0.2NiO2

Synthesis of Chemically Sharp Interface in NdNiO3/SrTiO3 Heterostructures

Extensive hydrogen incorporation is not necessary for superconductivity in topotactically reduced nickelates

Toward Reliable Synthesis of Superconducting Infinite Layer Nickelate Thin Films by Topochemical Reduction

Freestanding perovskite and infinite-layer nickelate membranes

Achieving superconductivity in infinite-layer nickelate thin films by aluminum sputtering deposition

Investigation of hydrogen incorporations in bulk infinite-layer nickelates

Phase Diagram of Infinite-layer Nickelate Compounds from First- and Second-principles Calculations

Limits to the strain engineering of layered square-planar nickelate thin films

Superconductivity in the parent infinite-layer nickelate NdNiO$_2$