Increasing the resolution of transmission electron microscopy by computational ghost imaging

P. Rosi,L. Viani,E. Rotunno,S. Frabboni,A. H. Tavabi,R. E. Dunin-Borkowski,A. Roncaglia,V. Grillo
2023-11-10
Abstract:By means of numerical simulations, we demonstrate the innovative use of computational ghost imaging in transmission electron microscopy to retrieve images with a resolution that overcomes the limitations imposed by coherent aberrations. The method requires measuring the intensity on a single pixel detector with a series of structured illuminations. The success of the technique is improved if the probes are made to resemble the sample and the patterns cover the area of interest evenly. By using a simple 8 electrode device as a specific example, a 2-fold increase in resolution beyond the aberration limit is demonstrated to be possible under realistic experimental conditions.
Instrumentation and Detectors,Optics
What problem does this paper attempt to address?
This paper discusses how to improve the resolution of Transmission Electron Microscopy (TEM) through the use of Computational Ghost Imaging (CGI) technology. Traditionally, the resolution of TEM is limited by wavefront distortion (i.e. aberrations) in the optical system. The paper proposes an innovative approach that utilizes a series of structured illumination and single-pixel detectors to collect information, and then reconstructs the image through computation to overcome the limitations caused by aberrations. In numerical simulations, the researchers demonstrate that CGI can achieve comparable resolution to aberration-corrected STEM imaging even on uncorrected instruments. Using MoS2 twisted bilayer structures as an example, they show that CGI can achieve a resolution of approximately 0.64 Å, surpassing the aberration-limited resolution of 1.63 Å. The key lies in the design of an electron phase modulator composed of 4 pairs of electrodes, which can generate illumination patterns similar to sample structures and help improve the intensity of the measurement signal. The paper also emphasizes two important factors: the illumination pattern should be similar to the sample to increase measurement intensity, and the illumination intensity of the same point under different patterns should be independent and uniformly distributed. The authors demonstrate through experiments and numerical simulations how this electron modulator based on Microelectromechanical Systems (MEMS) generates illumination patterns that can be used for CGI, and discuss the impact of factors such as coherence, noise, and sampling rate on reconstruction quality. Overall, this work provides a potential new approach to improve the resolution of TEM without the need for expensive aberration correctors, particularly in quantitative imaging of thin crystalline samples, where the resolution can be comparable to ptychography reconstruction.