Automatic test generation for digital electronic circuits

T. Chakraborty,S. Davidson,F. Maamari,K. Cheng
DOI: https://doi.org/10.1002/J.1538-7305.1994.TB00575.X
1994-03-04
AT&T Technical Journal
Abstract:Automatic test generators produce test vectors for a digital circuit, given a description of the circuit at the gate level. For small and testable circuits, a high-quality test can be produced without modifying the circuit. For larger, harder-to-test circuits, the technique of partial scan can provide excellent fault coverage with limited circuit modification. Where test modification can not be tolerated, test-generation tools can help by providing a powerful testability diagnostic capability to assist the designer in writing tests by hand.
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