Abstract:Single‐element tellurium (Te) films are experimentally demonstrated to host an in‐plane spontaneous electronic polarization, evident with reversed band‐bending trends at opposite polarization edges in spatially resolved spectra and conductance mappings. The imaged moiré superlattice can be effectively tuned at the polarization edges. The polarization can survive irrespective of the film thickness and supporting substrates, validating its robustness and universality. Single‐element polarization in low dimensions is fascinating for constructing next‐generation nanoelectronics with multiple functionalities, yet remains difficult to access with satisfactory performance. Here, spectroscopic evidences are presented for the spontaneous electronic polarization in tellurium (Te) films thinned down to bilayer, characterized by low‐temperature scanning tunneling microscopy/spectroscopy. The unique chiral structure and centrosymmetry‐breaking character in 2D Te gives rise to sizable in‐plane polarization with accumulated charges, which is demonstrated by the reversed band‐bending trends at opposite polarization edges in spatially resolved spectra and conductance mappings. The polarity of charges exhibits intriguing influence on imaging the moiré superlattice at the Te‐graphene interface. Moreover, the plain spontaneous polarization robustly exists for various film thicknesses, and can universally preserve against different epitaxial substrates. The experimental validations of considerable electronic polarization in Te multilayers thus provide a realistic platform for promisingly facilitating reliable applications in microelectronic devices.

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