Review on Infrared Nanospectroscopy of Natural 2D Phyllosilicates

Raphaela De Oliveira,Alisson R. Cadore,Raul O. Freitas,Ingrid D. Barcelos
DOI: https://doi.org/10.1364/JOSAA.482518
2023-08-08
Abstract:Phyllosilicates emerge as a promising class of large bandgap lamellar insulators. Their applications have been explored from fabrication of graphene-based devices to 2D heterostructures based on transition metal dicalcogenides with enhanced optical and polaritonics properties. In this review, we provide an overview on the use of IR s-SNOM for studying nano-optics and local chemistry of a variety of 2D natural phyllosilicates. Finally, we bring a brief update on applications that combine natural lamellar minerals into multifunctional nanophotonic devices driven by electrical control.
Mesoscale and Nanoscale Physics,Materials Science
What problem does this paper attempt to address?
The main purpose of this paper is to explore the application of infrared nanospectroscopy (IR nanospectroscopy) in the study of natural 2D phyllosilicates. Specifically, this review article demonstrates how infrared nanospectroscopy helps to reveal the optical properties of 2D natural layered silicates and their van der Waals (vdW) heterostructures. The paper discusses in detail the use of scattering-type scanning near-field optical microscopy (s-SNOM) combined with synchrotron radiation techniques (i.e., synchrotron infrared nanospectroscopy, SINS) to study the vibrational characteristics of these materials. The authors selected several representative layered silicate samples for study, including talc, muscovite, phlogopite, and clinochlore, as well as serpentine as case studies, covering the main aspects of the entire family of layered silicates. Through these techniques, researchers were able to identify the vibrational characteristics of layered silicates with different numbers of layers and explore their optical responses at the nanoscale. Additionally, the article introduces synchrotron infrared nanospectroscopy as a powerful tool for studying the optoelectronic vibrational properties of atomic layer materials. Due to the limitations of traditional Raman spectroscopy in detecting single or multiple layers, the SINS technique has become an important alternative method because of its high spatial resolution and sensitivity to vibrational modes. This allows researchers to precisely analyze the chemical composition and optical properties of these materials at the nanoscale.