Interfacial Passivation Enormously Enhances Electroluminescence of Triphenylphosphine Cu4I4 Cube

Ying Li,Xianfa Zhang,Yi Man,Shiwei Xu,Jing Zhang,Guangming Zhang,Shuo Chen,Chunbo Duan,Chunmiao Han,Hui Xu
DOI: https://doi.org/10.1002/adma.202302984
IF: 29.4
2023-06-04
Advanced Materials
Abstract:Defect is one of the key factors limiting optoelectronic performances of organic‐inorganic hybrid systems. Although high‐efficiency bidentate ligands based electroluminescent (EL) clusters reported, until present, only few EL clusters based on monodentate ligands were realized, since their structural unstability induces more surface/interface defects. Herein, this bottleneck is firstly overcome in virtue of interfacial passivation by electron transporting layers (ETL). Through using TmPyPB with meta‐linked pyridines as ETL, photoluminescent (PL) and EL quantum efficiencies of the simplest monophosphine Cu4I4 cube [TPP]4Cu4I4 are greatly improved by ∼2 and 23 folds, respectively, as well as about 200 folds increased luminance, corresponding to a huge leap from nearly unlighted ( 3000 nits). The passivation effect of TmPyPB on surface defects of cluster layer is embodied as preventing interfacial charge trapping and suppressing exciton nonradiation. This article is protected by copyright. All rights reserved
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
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