Atomically Resolved Defect-Engineering Scattering Potential in 2D Semiconductors

Hao-Yu Chen,Hung-Chang Hsu,Jhih-Yuan Liang,Bo-Hong Wu,Yi-Feng Chen,Chuan-Chun Huang,Ming-Yang Li,Iuliana P Radu,Ya-Ping Chiu
DOI: https://doi.org/10.1021/acsnano.4c02066
IF: 17.1
2024-06-27
ACS Nano
Abstract:Engineering atomic-scale defects has become an important strategy for the future application of transition metal dichalcogenide (TMD) materials in next-generation electronic technologies. Thus, providing an atomic understanding of the electron-defect interactions and supporting defect engineering development to improve carrier transport is crucial to future TMDs technologies. In this work, we utilize low-temperature scanning tunneling microscopy/spectroscopy (LT-STM/S) to elicit how distinct...
materials science, multidisciplinary,nanoscience & nanotechnology,chemistry, physical
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