Simplified method for the conversion of luminescence signals from silicon wafers and solar cells into implied voltages

Soma Zandi,Ziv Hameiri,Arman Mahboubi Soufiani,Juergen W. Weber,Thorsten Trupke
DOI: https://doi.org/10.1016/j.solmat.2024.112716
IF: 6.9
2024-03-11
Solar Energy Materials and Solar Cells
Abstract:Electroluminescence and photoluminescence imaging of crystalline silicon solar cells are powerful characterization techniques for research and industrial applications. Both techniques can provide spatially resolved data of the implied open-circuit voltage, a critical parameter for photovoltaic devices. However, the conversion of luminescence intensities into implied voltages often requires a challenging calibration process, which must be performed separately for distinct sample types. Here, we present a novel voltage calibration method for silicon wafers and cells, which eliminates the need for sample-specific calibration. We demonstrate that with a suitable selection of optical filters, the error in the implied open-circuit voltage for typical textured silicon solar cells and wafers can be limited to 3 mV.
materials science, multidisciplinary,physics, applied,energy & fuels
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