Eff-3DPSeg: 3D organ-level plant shoot segmentation using annotation-efficient point clouds

Liyi Luo,Xintong Jiang,Yu Yang,Eugene Roy Antony Samy,Mark Lefsrud,Valerio Hoyos-Villegas,Shangpeng Sun
DOI: https://doi.org/10.48550/arXiv.2212.10263
2022-12-20
Abstract:Reliable and automated 3D plant shoot segmentation is a core prerequisite for the extraction of plant phenotypic traits at the organ level. Combining deep learning and point clouds can provide effective ways to address the challenge. However, fully supervised deep learning methods require datasets to be point-wise annotated, which is extremely expensive and time-consuming. In our work, we proposed a novel weakly supervised framework, Eff-3DPSeg, for 3D plant shoot segmentation. First, high-resolution point clouds of soybean were reconstructed using a low-cost photogrammetry system, and the Meshlab-based Plant Annotator was developed for plant point cloud annotation. Second, a weakly-supervised deep learning method was proposed for plant organ segmentation. The method contained: (1) Pretraining a self-supervised network using Viewpoint Bottleneck loss to learn meaningful intrinsic structure representation from the raw point clouds; (2) Fine-tuning the pre-trained model with about only 0.5% points being annotated to implement plant organ segmentation. After, three phenotypic traits (stem diameter, leaf width, and leaf length) were extracted. To test the generality of the proposed method, the public dataset Pheno4D was included in this study. Experimental results showed that the weakly-supervised network obtained similar segmentation performance compared with the fully-supervised setting. Our method achieved 95.1%, 96.6%, 95.8% and 92.2% in the Precision, Recall, F1-score, and mIoU for stem leaf segmentation and 53%, 62.8% and 70.3% in the AP, AP@25, and AP@50 for leaf instance segmentation. This study provides an effective way for characterizing 3D plant architecture, which will become useful for plant breeders to enhance selection processes.
Computer Vision and Pattern Recognition,Artificial Intelligence
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