Accelerated Nano-Optical Imaging through Sparse Sampling
Matthew Fu,Suheng Xu,Shuai Zhang,Francesco L. Ruta,Jordan Pack,Rafael A. Mayer,Xinzhong Chen,Samuel L. Moore,Daniel J. Rizzo,Bjarke S. Jessen,Matthew Cothrine,David G. Mandrus,Kenji Watanabe,Takashi Taniguchi,Cory R. Dean,Abhay N. Pasupathy,Valentina Bisogni,P. James Schuck,Andrew J. Millis,Mengkun Liu,D. N. Basov
DOI: https://doi.org/10.1021/acs.nanolett.3c03733
IF: 10.8
2024-02-09
Nano Letters
Abstract:The integration time and signal-to-noise ratio are inextricably linked when performing scanning probe microscopy based on raster scanning. This often yields a large lower bound on the measurement time, for example, in nano-optical imaging experiments performed using a scanning near-field optical microscope (SNOM). Here, we utilize sparse scanning augmented with Gaussian process regression to bypass the time constraint. We apply this approach to image charge-transfer polaritons in graphene...
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology