Abstract:Mid-circuit measurements are a key component in many quantum information computing protocols, including quantum error correction, fault-tolerant logical operations, and measurement based quantum computing. As such, techniques to quickly and efficiently characterize or benchmark their performance are of great interest. Beyond the measured qubit, it is also relevant to determine what, if any, impact mid-circuit measurement has on adjacent, unmeasured, spectator qubits. Here, we present a mid-circuit measurement benchmarking suite developed from the ubiquitous paradigm of randomized benchmarking. We show how our benchmarking suite can be used to both detect as well as quantify errors on both measured and spectator qubits, including measurement-induced errors on spectator qubits and entangling errors between measured and spectator qubits. We demonstrate the scalability of our suite by simultaneously characterizing mid-circuit measurement on multiple qubits from an IBM Quantum Falcon device, and support our experimental results with numerical simulations. Further, using a mid-circuit measurement tomography protocol we establish the nature of the errors identified by our benchmarking suite.

What problem does this paper attempt to address?

The problem that this paper attempts to solve is how to quickly and efficiently characterize or benchmark the performance of mid - circuit measurements in quantum computing, especially in the process of implementing quantum error - correction codes and fault - tolerant quantum computing. Specifically, the authors developed a mid - circuit measurement randomized benchmarking suite (mcm - rb suite) based on randomized benchmarking (RB), which is used to detect and quantify the impact of mid - circuit measurements on the measured qubit and spectator qubits, including measurement - induced errors and entanglement errors between the measurement and spectator qubits. In addition, they also demonstrated the scalability of this suite by simultaneously characterizing mid - circuit measurements of multiple qubits on IBM Quantum Falcon devices, and supported the experimental results through numerical simulations. ### Specific problems include: 1. **Performance Characterization of Mid - Circuit Measurements**: How to quickly and effectively evaluate the performance of mid - circuit measurements, especially in quantum error - correction and fault - tolerant logic operations. 2. **Impact on Spectator Qubits**: Determine whether and how mid - circuit measurements affect adjacent qubits that are not measured. 3. **Error Detection and Quantification**: How to detect and quantify various errors generated during mid - circuit measurement processes, including measurement - induced errors and entanglement errors between the measurement and spectator qubits. 4. **Scalability**: Develop a scalable method that can simultaneously characterize mid - circuit measurements on multiple qubits. ### Solutions: - **mcm - rb Suite**: This suite includes three main protocols: - **mcm - rb**: Insert mid - circuit measurements between Clifford gates of control qubits. - **delay - rb**: Insert a delay equal to the mid - circuit measurement time between Clifford gates of control qubits. - **mcm - rep**: Insert a delay equal to the Clifford gate time of control qubits between mid - circuit measurements and repeatedly measure auxiliary qubits. - **Error Classification and Detection**: By comparing the decay curves of different protocols, error types caused by mid - circuit measurements can be identified and quantified, including non - QND measurement, measurement - induced control qubit errors, two - qubit errors, etc. - **Experimental Verification**: Experiments were carried out on IBM Quantum Falcon devices, demonstrating the practicality and scalability of the mcm - rb suite, and the experimental results were further supported by numerical simulations. In conclusion, through the development and verification of the mcm - rb suite, this paper provides an effective method to characterize and benchmark the performance of mid - circuit measurements, which is of great significance for promoting the development of quantum error - correction and fault - tolerant quantum computing.

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