Julia D. Hannukainen,Miguel F. Martinez,Jens H. Bardarson,Thomas Klein Kvorning
Abstract:Local topological markers, topological invariants evaluated by local expectation values, are valuable for characterizing topological phases in materials lacking translation invariance. The Chern marker -- the Chern number expressed in terms of the Fourier transformed Chern character -- is an easily applicable local marker in even dimensions, but there are no analogous expressions for odd dimensions. We provide general analytic expressions for local markers for free-fermion topological states in odd dimensions protected by local symmetries: a Chiral marker, a local $\mathbb Z$ marker which in case of translation invariance is equivalent to the chiral winding number, and a Chern-Simons marker, a local $\mathbb Z_2$ marker characterizing all nonchiral phases in odd dimensions. We achieve this by introducing a one-parameter family $P_{\vartheta}$ of single-particle density matrices interpolating between a trivial state and the state of interest. By interpreting the parameter $\vartheta$ as an additional dimension, we calculate the Chern marker for the family $P_{\vartheta}$. We demonstrate the practical use of these markers by characterizing the topological phases of two amorphous Hamiltonians in three dimensions: a topological superconductor ($\mathbb Z$ classification) and a topological insulator ($\mathbb Z_2$ classification).
What problem does this paper attempt to address?
### What problem does this paper attempt to solve?
This paper aims to solve the problem of characterizing the topological phases of disordered or amorphous topological matter in odd dimensions. Specifically, the authors provide a method for defining local topological markers in odd dimensions, which can effectively characterize topological phases in systems lacking translational symmetry.
#### Background and Problem Description
1. **Importance of Topological Invariants**:
- Topological invariants are very important for characterizing the topological phases of materials. For example, in even dimensions, the Chern number is a commonly used topological invariant that can be used to characterize the topological phases in crystalline materials with translational symmetry.
- However, for structures far from the translational symmetry limit (such as amorphous materials), traditional momentum - space - based topological invariants are no longer applicable.
2. **Limitations of Existing Methods**:
- In even dimensions, the Chern marker has been widely studied and applied.
- But in odd dimensions, similar methods have not been fully developed, especially for free - fermion topological states.
3. **Practical Requirements**:
- Amorphous materials are easier to prepare experimentally, so understanding their topological properties has not only theoretical significance but also technological application prospects.
#### Solution
To solve the above problems, the authors introduce the following new local topological markers:
1. **Chiral Marker**:
- By introducing a family of parameterized projection operators \( P_\vartheta \), the chiral topological invariant in odd dimensions is expressed in the form of local expectation values.
- The specific formula is as follows:
\[
\nu(r) = \sum_\alpha \int_0^{\pi/2} d\vartheta \, \varepsilon_{i_0, \ldots, i_D} \left[ P_\vartheta X_{i_0} P_\vartheta \cdots X_{i_D} P_\vartheta \right](r, \alpha), (r, \alpha)
\]
\[
\frac{[(D + 1)/2]!}{2i(2\pi i)^{(D - 1)/2}}
\]
where \( X_0 = i \partial_\vartheta \) and \( D \) is an odd dimension.
2. **Chern - Simons Marker**:
- It is used to characterize the Z2 invariant of odd - dimensional systems that break chiral symmetry.
- Through the path integral method, the Chern - Simons invariant is converted into a local marker form.
3. **Application Examples**:
- The authors show how to use these markers to characterize the topological phases of two three - dimensional amorphous Hamiltonians: one is a time - reversal - invariant topological insulator (class AII), and the other is a topological superconductor with both chiral and time - reversal symmetries (class DIII).
#### Conclusion
By introducing these new local topological markers, the authors provide an effective method to characterize the topological phases of amorphous materials in odd dimensions, fill this gap in this field, and provide a theoretical basis for further research.
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In summary, this paper solves the difficult problem of characterizing the topological phases of amorphous materials in odd dimensions, proposes a new set of local topological marker methods, and verifies their effectiveness in actual systems.