Abstract:Defect engineering has been profoundly employed to confer desirable functionality to materials that pristine lattices inherently lack. Although single atomic-resolution scanning transmission electron microscopy (STEM) images are widely accessible for defect engineering, harnessing atomic-scale images containing various defects through traditional image analysis methods is hindered by random noise and human bias. Yet the rise of deep learning (DL) offering an alternative approach, its widespread application is primarily restricted by the need for large amounts of training data with labeled ground truth. In this study, we propose a two-stage method to address the problems of high annotation cost and image noise in the detection of atomic defects in monolayer 2D materials. In the first stage, to tackle the issue of data scarcity, we employ a two-state transformation network based on U-GAT-IT for adding realistic noise to simulated images with pre-located ground truth labels, thereby infinitely expanding the training dataset. In the second stage, atomic defects in monolayer 2D materials are effectively detected with high accuracy using U-Net models trained with the data generated in the first stage, avoiding random noise and human bias issues. In both stages, we utilize segmented unit-cell-level images to simplify the model's task and enhance its accuracy. Our results demonstrate that not only sulfur vacancies, we are also able to visualize oxygen dopants in monolayer MoS2, which are usually overwhelmed by random background noise. As the training was based on a few segmented unit-cell-level realistic images, this method can be readily extended to other 2D materials. Therefore, our results outline novel ways to train the model with minimized datasets, offering great opportunities to fully exploit the power of machine learning (ML) applicable to a broad materials science community.

STEM image analysis based on deep learning: identification of vacancy defects and polymorphs of ${MoS_2}$

Accurate atomic scanning transmission electron microscopy analysis enabled by deep learning

Single-image based deep learning for precise atomic defects identification

Single-Image-Based Deep Learning for Precise Atomic Defect Identification

Automatic Identification of Crystal Structures and Interfaces via Artificial-Intelligence-based Electron Microscopy

Deep Learning Analysis of Defect and Phase Evolution During Electron Beam Induced Transformations in WS2

Probing electron beam induced transformations on a single defect level via automated scanning transmission electron microscopy

Deep Learning of Atomically Resolved Scanning Transmission Electron Microscopy Images: Chemical Identification and Tracking Local Transformations

Deep-Learning Recognition of Scanning Transmission Electron Microscopy: Quantifying and Mitigating the Influence of Gaussian Noises

Robust multi-scale multi-feature deep learning for atomic and defect identification in Scanning Tunneling Microscopy on H-Si(100) 2x1 surface

Machine Learning Identification of Impurities in the STM Images

AtomGAN: unsupervised deep learning for fast and accurate defect detection of 2D materials at the atomic scale

Combining Machine Learning Algorithms with Traditional Methods for Resolving the Atomic-Scale Dynamic Structure Reconstruction of Monolayer MoS2 in High-Resolution Transmission Electron Microscopy

A deep learning framework for automated molecular recognitions in scanning probe microscopy images.

Learning-based Defect Recognition for Quasi-Periodic Microscope Images

Exploring electron-beam induced modifications of materials with machine-learning assisted high temporal resolution electron microscopy

Unsupervised machine learning combined with 4D scanning transmission electron microscopy for bimodal nanostructural analysis

Introducing Vacancy Defects by Rapid Quenching in FCC Metal for Deep Learning Micrograph Dataset

Detecting Atomic Scale Surface Defects in STM of TMDs with Ensemble Deep Learning

Intelligent Identification of MoS2 Nanostructures with Hyperspectral Imaging by 3D-CNN

Dynamic STEM-EELS for single-atom and defect measurement during electron beam transformations