Non-contact Andreev reflection as a direct probe of superconductivity on the atomic scale

Wonhee Ko,Jose L. Lado,Petro Maksymovych

DOI: https://doi.org/10.1021/acs.nanolett.2c00697

2022-02-04

Abstract:Direct detection of superconductivity has long been a key strength of point-contact Andreev reflection. However, its applicability to atomic-scale imaging is limited by the mechanical contact of the Andreev probe. To this end, we present a new method to probe Andreev reflection in a tunnel junction, leveraging tunneling spectroscopy and junction tunability to achieve quantitative detection of Andreev scattering. This method enables unambiguous assignment of superconducting origins of current-carrying excitations as well as detection of higher order Andreev processes in atomic-scale junctions. We furthermore revealed distinct sensitivity of Andreev reflection to natural defects, such as step edges, even in classical superconductors. The methodology opens a new path to nanoand atomic-scale imaging of superconducting properties, including disordered superconductors and proximity to phase transitions.

Superconductivity,Mesoscale and Nanoscale Physics

What problem does this paper attempt to address?

This paper aims to solve the problem of how to directly detect superconducting properties at the atomic scale. Although traditional methods such as point - contact Andreev reflection (PCAR) have been successfully used to detect the basic properties of superconductors, they are limited by mechanical contact probes in the application of atomic - scale imaging. Therefore, the authors propose a new non - contact Andreev reflection (NCAR) technique to achieve quantitative detection of Andreev scattering through tunneling spectroscopy of tunnel junctions and the tunability of the junctions. This method can not only clearly assign the superconducting origin of current carriers, but also detect high - order Andreev processes in atomic - scale junctions. In addition, this method reveals the unique sensitivity of Andreev reflection to natural defects (such as step edges), even in classical superconductors. This technique opens up a new path for imaging superconducting properties at the nano - and even atomic - scale, including the properties of disordered superconductors and those near phase transitions.