Abstract:We devise reduced-dimension metrics for effectively measuring the distance between two points (i.e., microstructures) in the microstructure space and quantifying the pathway associated with microstructural evolution, based on a recently introduced set of hierarchical $n$-point polytope functions $P_n$. The $P_n$ functions provide the probability of finding particular $n$-point configurations associated with regular $n$-polytopes in the material system, and a special sub-set of the standard $n$-point correlation functions $S_n$ that effectively decomposes the structural features in the systems into regular polyhedral basis with different symmetry. The $n$-th order metric $\Omega_n$ is defined as the $\mathbb{L}_1$ norm associated with the $P_n$ functions of two distinct microstructures. By choosing a reference initial state (i.e., a microstructure associated with $t_0 = 0$), the $\Omega_n(t)$ set quantifies the evolution of distinct polyhedral symmetries and can in principle capture emerging polyhedral symmetries that are not apparent in the initial state. To demonstrate their utility, we apply the $\Omega_n$ metrics to a 2D binary system undergoing spinodal decomposition to extract the phase separation dynamics via the temporal scaling behavior of the corresponding $\Omega_n(t)$, which reveals mechanisms governing the evolution. Moreover, we employ $\Omega_n(t)$ to analyze pattern evolution during vapor-deposition of phase-separating alloy films with different surface contact angles, which exhibit rich evolution dynamics including both unstable and oscillating patterns. The $\Omega_n$ metrics have potential applications in establishing quantitative processing-structure-property relationships, as well as real-time processing control and optimization of complex heterogeneous material systems.

What problem does this paper attempt to address?

The problem that this paper attempts to solve is how to effectively quantify the evolution process of material microstructures in multi - scale space - time. Specifically, the author proposes a dimension - reduction measurement method based on hierarchical n - point polytope functions ($P_n$) to measure the distance between two points (i.e., microstructures) in the microstructure space and to quantify the paths related to microstructure evolution. This method can capture the emergence of polyhedral symmetries that are not obvious in the initial state, thus providing a new way to understand and analyze the dynamic behavior of material systems. ### Main contributions of the paper 1. **Definition of the n - order metric $\Omega_n$**: - By using the $P_n$ function, an n - order metric $\Omega_n$ is defined to measure the "distance" between two different microstructures. - The specific formula is: \[ \Omega_n(t)=\frac{1}{N(L)}\sum_{r = 0}^{L}|P_n(r;t_2)-P_n(r;t_1)| \] where $L$ is the maximum polyhedral side length considered, $N(L)$ is the number of polyhedra of different sizes, and $P_n(r;t)$ is the probability of an n - point polytope with side length $r$ at time $t$. 2. **Application examples**: - **Phase separation dynamics during spin decomposition**: The $\Omega_n$ metric is applied to a 2D binary system, and the phase separation dynamics are extracted through the time - scaling behavior $\Omega_n(t)$. - **Pattern evolution during alloy thin - film deposition**: The $\Omega_n$ metric is used to analyze the pattern evolution during alloy thin - film deposition at different surface contact angles, revealing rich evolution dynamics including unstable and oscillatory modes. 3. **Theoretical basis**: - The $P_n$ function provides the probability of finding a specific n - point configuration in a material system, which is associated with regular n - polyhedra. - By selecting a reference initial state (i.e., the microstructure at $t_0 = 0$), the set of $\Omega_n(t)$ can quantify the evolution of different polyhedral symmetries and capture the emerging symmetries that are not obvious in the initial state. ### Method overview 1. **n - point polytope function $P_n$**: - $P_n(r;t)$ represents the probability that all vertices of an n - point polytope with side length $r$ at time $t$ fall within the phase of interest. - For a statistically uniform and isotropic system, $P_n(r = 0;t)=\phi(t)$ and $P_n(r\rightarrow\infty;t)=\phi^n(t)$, where $\phi(t)$ is the volume fraction of randomly placed points falling within the phase of interest at time $t$. 2. **Distance metric $\Omega_n$ based on $P_n$**: - $\Omega_n(t)$ measures the "distance" between two different microstructures by calculating the $L_1$ norm of the $P_n$ function between them. - By selecting a global reference point (such as the initial microstructure $M(t = 0)$), $\Omega_n(t)$ can measure the "distance" between the microstructure $M(t)$ at time $t$ and the initial microstructure. 3. **Time - dependent $\Omega_n(t)$ and time - scaling of volume fraction**: - The time - scaling behavior of $\Omega_n(t)$ encodes information about the evolution dynamics of the material system. - By analyzing the time - scaling of $\Omega_n(t)$, the time - scaling of the volume fraction can be extracted, further understanding the evolution mechanism of the system. ### Results and discussion 1. **Spin decomposition in 2D binary systems**: - Through...

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