Capacitive imaging using fused amplitude and phase information for improved defect detection

Silvio Amato,David Hutchins,Xiaokang Yin,Marco Ricci,Stefano Laureti
DOI: https://doi.org/10.1016/j.ndteint.2021.102547
2021-03-26
Abstract:This paper introduces an improved image processing method usable in capacitive imaging applications. Standard capacitive imaging tends to prefer amplitude-based images over the use of phase due to better signal-to-noise ratios. The new approach exploits the best features of both types of information by combining them to form clearer images, hence improving both defect detection and characterization in non-destructive evaluation. The methodology is demonstrated and optimized using a benchmark sample. Additional experiments on glass fibre composite sample illustrate the advantages of the technique.
Signal Processing
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