Magnetocrystalline anisotropy imprinting of an antiferromagnet on an amorphous ferromagnet in FeRh/CoFeB heterostructures
Yali Xie,Qingfeng Zhan,Yong Hu,Xiao Hu,Xiaodan Chi,Chenyu Zhang,Huali Yang,Wenhui Xie,Xiaoyan Zhu,Jianhua Gao,Wenjuan Cheng,Dongmei Jiang,Run-Wei Li
DOI: https://doi.org/10.1038/s41427-020-00248-x
IF: 10.761
2020-10-16
NPG Asia Materials
Abstract:Abstract Magnetic anisotropy is a fundamental key parameter of magnetic materials that determines their applications. For ferromagnetic materials, the magnetic anisotropy can be easily detected by using conventional magnetic characterization techniques. However, due to the magnetic compensated structure in antiferromagnetic materials, synchrotron measurements, such as X-ray magnetic linear dichroism, are often needed to probe their magnetic properties. In this work, we observed an imprinted fourfold magnetic anisotropy in the amorphous ferromagnetic layer of FeRh/CoFeB heterostructures. The MOKE and ferromagnetic resonance measurements show that the easy magnetization axes of the CoFeB layer are along the FeRh〈110〉 and FeRh〈100〉 directions for the epitaxially grown FeRh layer in the antiferromagnetic and ferromagnetic states, respectively. The combined Monte Carlo simulation and first-principles calculation indicate that the fourfold magnetic anisotropy of the amorphous CoFeB layer is imprinted due to the interfacial exchange coupling between the CoFeB and FeRh moments from the magnetocrystalline anisotropy of the epitaxial FeRh layer. This observation of imprinting the magnetocrystalline anisotropy of antiferromagnetic materials on easily detected ferromagnetic materials may be applied to probe the magnetic structures of antiferromagnetic materials without using synchrotron methods.
materials science, multidisciplinary