Dark-based Optical Sectioning assists Background Removal in Fluorescence Microscopy

Ruijie Cao,Yaning Li,Wenyi Wang,Guoxun Zhang,Gang Wang,Yu Sun,Wei Ren,Jing Sun,Yiwei Hou,Xinzhu Xu,Jiakui Hu,Yanye Lu,Changhui Li,Jiamin Wu,Meiqi Li,Junle Qu,Peng Xi
DOI: https://doi.org/10.1101/2024.03.02.578598
2024-03-03
Abstract:A fundamental challenge in fluorescence microscopy is the defocused background caused by scattering light, optical aberration, or limited axial resolution. Severe defocus backgrounds will submerge the in-focus information and cause artifacts in the following processing. Here, we leverage a priori knowledge about dark channels of biological structures and dual frequency separation to develop a single-frame defocus removal algorithm. It stably improves the signal-to-background ratio and structural similarity index measure of images by approximately 10-fold, and recovers in-focus signal with 85% accuracy, even when the defocus background is 50 times larger than in-focus information. Our Dark-based optical sectioning approach (Dark sectioning) is fully compatible with various microscopy techniques, such as wide-filed microscopy, polarized microscopy, laser-scanning / spinning-disk confocal microscopy, stimulated emission depletion microscopy, lightsheet microscopy, and light-field microscopy. It also complements reconstruction or processing algorithms such as deconvolution, structure illumination microscopy, and super-resolution optical fluctuation imaging.
Bioinformatics
What problem does this paper attempt to address?
This paper attempts to solve the out - of - focus background problem in fluorescence microscope imaging caused by scattered light, optical aberration or limited axial resolution. Severe out - of - focus background can overwhelm the in - focus information and generate artifacts in subsequent processing. By utilizing the prior knowledge of the dark channel of biological structures and the dual - frequency separation technique, the authors developed a single - frame defocusing algorithm - Dark sectioning - to stably improve the Signal - to - Background Ratio (SBR) and the Structural Similarity Index Measure (SSIM) of the image and restore the in - focus signal, achieving an accuracy of about 85% even when the out - of - focus background is 50 times larger than the in - focus information. Specifically, this method can: 1. **Significantly improve image quality**: By removing the out - of - focus background, the SBR and SSIM of the image are increased by approximately 10 times respectively. 2. **Be widely compatible with multiple microscopic techniques**: Including wide - field microscopes, polarization microscopes, laser - scanning/rotating - disk confocal microscopes, stimulated - emission - depletion microscopes, light - sheet microscopes and light - field microscopes. 3. **Supplement reconstruction or processing algorithms**: Such as deconvolution, structured - illumination microscopy and super - resolution optical fluctuation imaging, etc. ### Main contributions - **Innovatively apply the dark - channel - first principle**: By adjusting the block size and introducing an inhomogeneous background distribution, the limitations of the traditional dark - channel method in fluorescence image applications are solved. - **Efficiently remove the out - of - focus background**: Even when the out - of - focus background is much larger than the in - focus information, it can still effectively retain the weak in - focus signal. - **Wide applicability**: Applicable to multiple microscopic techniques and image - processing algorithms, significantly improving the axial - sectioning ability. ### Method principle 1. **Definition of the dark channel**: \[ I_{\text{dark}}(x, y)=\min (I(x+\Delta x, y+\Delta y)) \] where \(\Delta x\) and \(\Delta y\) represent the block size, and the dark channel represents the minimum value in the RGB channels within a certain block size. 2. **Redefine the block size**: \[ [\Delta x, \Delta y]=\text{rec}(\text{PSF}) \] where \(\text{rec}(\cdot)\) represents the circumscribed rectangle size slightly larger than the point - spread function (PSF), which helps to better distinguish between in - focus and out - of - focus information. 3. **Image decomposition and processing**: - Decompose the image into a low - frequency part \(I_{\text{Lo}}(x, y)\) and a high - frequency part \(I_{\text{Hi}}(x, y)\). - Only perform dark - based optical sectioning on the low - frequency part to better preserve the weak signal. - Divide the low - frequency part into a background part \(A(x, y)\) and a background - free part \(J_{\text{Lo}}(x, y)\) through the transmission ratio \(t(x, y)\): \[ I_{\text{Lo}}(x, y)=t(x, y)\cdot J_{\text{Lo}}(x, y)+(1 - t(x, y))\cdot A(x, y) \] 4. **Final image synthesis**: \[ J(x, y)=J_{\text{Lo}}(x, y)+J_{\text{Hi}}(x, y) \] where \(J_{\text{Hi}}(x, y)=I_{\text{Hi}}(x, y)\), that is, the high - frequency part remains unchanged. ### Experimental verification - **Simulation experiment**: Using hollow spheres and linear structures for simulation, it is verified that Dark sectioning can still effectively restore the in - focus information when the in - focus intensity is only 2% of the out - of - focus information. - **Multi - modal verification**: Verified by multiple microscopic techniques such as HiLo, 2DSIM, 3DSIM, etc.