CTFFIND5 provides improved insight into quality, tilt and thickness of TEM samples

Johannes Elferich,Lingli Kong,Ximena Zottig,Nikolaus Grigorieff

DOI: https://doi.org/10.1101/2024.02.26.582023

2024-09-09

Abstract:Images taken by transmission electron microscopes are usually affected by lens aberrations and image defocus, among other factors. These distortions can be modeled in reciprocal space using the contrast transfer function (CTF). Accurate estimation and correction of the CTF is essential for restoring the high-resolution signal in cryogenic electron microscopy (cryoEM). Previously, we described the implementation of algorithms for this task in the TEM software package ( ). Here we show that taking sample characteristics, such as thickness and tilt, into account can improve CTF estimation. This is particularly important when imaging cellular samples, where measurement of sample thickness and geometry derived from accurate modeling of the Thon ring pattern helps judging the quality of the sample. This improved CTF estimation has been implemented in CTFFIND5, a new version of the TEM program CTFFIND. We evaluated the accuracy of these estimates using images of tilted aquaporin crystals and eukaryotic cells thinned by focused ion beam milling. We estimate that with micrographs of sufficient quality CTFFIND5 can measure sample tilt with an accuracy of 3° and sample thickness with an accuracy of 5 nm.

Biophysics

What problem does this paper attempt to address?

The paper mainly addresses the following issues:

1. **Improvement of CTF Estimation**: The paper introduces a new version of CTFFIND5, which improves the estimation of the contrast transfer function (CTF) by considering sample thickness and tilt angle. This is particularly important for cellular samples, as these samples are often thicker and may be tilted relative to the microscope's optical axis.

2. **Increased Accuracy**: With the improved CTF model, CTFFIND5 can more accurately estimate the sample's tilt angle (with an accuracy of 3°) and thickness (with an accuracy of 5 nm), which is crucial for assessing sample quality and recovering high-resolution information.

3. **Handling Thick Samples**: For thick samples prepared by focused ion beam (FIB) milling, CTFFIND5 can better fit the Thon ring pattern at high resolution and provide direct readings of the sample's geometric structure.

4. **Validation Method**: The paper validates the performance of CTFFIND5 on tilted and thick samples using experimental data and compares it with existing methods, demonstrating its advantages in terms of accuracy and applicability.

In summary, the paper aims to improve the quality and resolution of cryo-electron microscopy (cryoEM) images by enhancing CTF estimation methods, especially when dealing with thick and tilted samples.