Surpassing Light Inhomogeneities in Structured-Illumination Microscopy with FlexSIM

Emmanuel Soubies,Alejandro Nogueron,Florence Pelletier,Thomas Mangeat,Christophe Leterrier,Michael Unser,Daniel Sage

DOI: https://doi.org/10.1101/2023.12.20.572677

2024-07-03

Abstract:Super-resolution structured-illumination microscopy (SIM) is a powerful technique that allows one to surpass the diffraction limit by up to a factor two. Yet, its practical use is hampered by its sensitivity to imaging conditions which makes it prone to reconstruction artifacts. In this work, we present FlexSIM, a flexible SIM reconstruction method capable to handle highly challenging data. Specifically, we demonstrate the ability of FlexSIM to deal with the distortion of patterns, the high level of noise encountered in live imaging, as well as out-of-focus fluorescence. Moreover, we show that FlexSIM achieves state-of-the-art performance over a variety of open SIM datasets.

Biophysics

What problem does this paper attempt to address?

### Problems the paper attempts to solve

The paper aims to solve the problem of reconstruction artifacts encountered in the practical application of super - resolution structured - illumination microscopy (SIM). Specifically, although the SIM technology can transfer high - frequency components into the band - pass range of the optical system through a specific structured - illumination pattern, thereby achieving imaging beyond the diffraction limit, it is very sensitive to imaging conditions and prone to produce reconstruction artifacts. These problems limit the wide application of SIM technology, especially when dealing with complex samples (such as live - cell imaging).

### Main contributions

1. **FlexSIM method**: The paper proposes FlexSIM, a flexible SIM reconstruction method that can handle highly challenging data. FlexSIM is particularly good at handling the following situations:
- **Pattern distortion**: FlexSIM can deal with the illumination pattern distortion caused by the optical system or sample characteristics.
- **High noise level**: In live - cell imaging, FlexSIM can handle data with a high noise level.
- **Out - of - focus fluorescence**: FlexSIM can effectively reduce the impact of out - of - focus fluorescence.

2. **Advanced pattern estimation**: FlexSIM represents the illumination pattern in the experiment through an improved model, takes into account the low - frequency components, and estimates the phase and direction of the pattern through an automatic calibration method.

3. **Advanced image reconstruction**: FlexSIM uses a weighted least - squares data - fidelity term for reconstruction, while taking into account the effects of Poisson noise and background / out - of - focus fluorescence. In addition, FlexSIM also supports multiple regularization methods to improve the reconstruction quality.

### Experimental verification

The paper verifies the effectiveness of FlexSIM through multiple experiments, including:
- **Processing TIRF - SIM data**: It shows the performance of FlexSIM when processing TIRF - SIM data with non - uniform low - frequency components, which can significantly reduce grid artifacts.
- **Live - cell imaging**: Under extreme live - cell imaging conditions, FlexSIM can handle the problems of low photon collection and strong illumination inhomogeneity and generate high - quality reconstructed images.

### Conclusion

FlexSIM provides a reliable method for high - quality reconstruction on various SIM data, from the "ideal" data obtained under standard protocols and configurations to data in more challenging settings. This makes the SIM technology more practical in practical applications, especially when dealing with complex samples.