Deep neural networks for classifying complex features in diffraction images
Julian Zimmermann,Bruno Langbehn,Riccardo Cucini,Michele Di Fraia,Paola Finetti,Aaron C. LaForge,Toshiyuki Nishiyama,Yevheniy Ovcharenko,Paolo Piseri,Oksana Plekan,Kevin C. Prince,Frank Stienkemeier,Kiyoshi Ueda,Carlo Callegari,Thomas Möller,Daniela Rupp
DOI: https://doi.org/10.1103/PhysRevE.99.063309
IF: 2.707
2019-10-07
Physical Review E
Abstract:Intense short-wavelength pulses from free-electron lasers and high-harmonic-generation sources enable diffractive imaging of individual nanosized objects with a single x-ray laser shot. The enormous data sets with up to several million diffraction patterns present a severe problem for data analysis ... [Phys. Rev. E 99, 063309] Published Wed Jun 19, 2019
physics, fluids & plasmas, mathematical