Local Asymptotic Powers of Nonparametric and Semiparametric Tests for Fractional Integration
Xiaofeng Shao,Wei Biao Wu
DOI: https://doi.org/10.1016/j.spa.2006.08.002
IF: 1.43
2007-01-01
Stochastic Processes and their Applications
Abstract:The paper concerns testing long memory for fractionally integrated nonlinear processes. We show that the exact local asymptotic power is of order O[(log n)(-1)] for four popular nonparametric tests and is O (m(-1/2)), where m is the bandwidth which is allowed to grow as fast as n(kappa), kappa is an element of (0, 2/3), for the semiparametric Lagrange multiplier (LM) test proposed by Lobato and Robinson [I. Lobato, P.M. Robinson, A nonparametric test for I(0), Rev. Econom. Stud. 68 (1998) 475-495]. Our theory provides a theoretical justification for the empirical findings in finite sample simulations by Lobato and Robinson [I. Lobato, P.M. Robinson, A nonparametric test for I(0), Rev. Econom. Stud. 68 (1998) 475-495] and Giraitis et al. [L. Giraitis, P. Kokoszka, R. Leipus, G. Teyssiere, Rescaled variance and related tests for long memory in volatility and levels, J. Econometrics 112 (2003) 265-294] that nonparametric tests have lower power than LM tests in detecting long memory. (C) 2006 Elsevier B.V. All rights reserved.