Effect of lattice excitations on transient near edge X-ray absorption spectroscopy

N. Rothenbach,M. E. Gruner,K. Ollefs,C. Schmitz-Antoniak,S. Salamon,P. Zhou,R. Li,M. Mo,S. Park,X. Shen,S. Weathersby,J. Yang,X. J. Wang,O. Šipr,H. Ebert,K. Sokolowski-Tinten,R. Pentcheva,U. Bovensiepen,A. Eschenlohr,H. Wende
DOI: https://doi.org/10.1103/PhysRevB.104.144302
2021-04-30
Abstract:Time-dependent and constituent-specific spectral changes in soft near edge X-ray spectroscopy (XAS) of an [Fe/MgO]$_8$ metal/insulator heterostructure upon laser excitation are analyzed at the O K-edge with picosecond time resolution. The oxygen absorption edge of the insulator features a uniform intensity decrease of the fine structure at elevated phononic temperatures, which can be quantified by a simple simulation and fitting procedure presented here. Combining X-ray absorption spectroscopy with ultrafast electron diffraction measurements and ab initio calculations demonstrate that the transient intensity changes in XAS can be assigned to a transient lattice temperature. Thus, the sensitivity of transient near edge XAS to phonons is demonstrated.
Materials Science
What problem does this paper attempt to address?