Abstract:We introduce a microscopy technique that facilitates the prediction of spatial features of chirality of nanoscale samples by exploiting photo-induced optical force exerted on an achiral tip in the vicinity of the test specimen. The tip-sample interactive system is illuminated by structured light to probe both the transverse and longitudinal (with respect to the beam propagation direction) components of the sample magnetoelectric polarizability as the manifestation of its sense of handedness, i.e., chirality. We specifically prove that although circularly polarized waves are adequate to detect the transverse polarizability components of the sample, they are unable to probe the longitudinal component. To overcome this inadequacy, we propose a judiciously engineered combination of radially and azimuthally polarized beams, as optical vortices possessing pure longitudinal electric and magnetic field components along their vortex axis, respectively, hence probing longitudinal chirality. The proposed technique may benefit branches of science like stereochemistry, biomedicine, physical and material science, and pharmaceutics

What problem does this paper attempt to address?

The problem that this paper attempts to solve is to accurately measure the longitudinal and transverse chiral components of chiral samples on the nanoscale. Although traditional methods such as circular dichroism (CD) can detect the existence of chirality, they cannot provide high - resolution structural details and require a large amount of sample material. To solve these problems, the authors propose a new technique based on photo - induced force microscopy (PiFM), using structured light to probe the chiral properties of samples. Specifically, this technique is achieved through the following steps: 1. **Using structured light illumination**: Utilize the combination of radially and azimuthally polarized light beams, which have pure longitudinal electric and magnetic field components along their vortex axes and can effectively probe the longitudinal chiral components of samples. 2. **Photo - induced force measurement**: Place a non - chiral probe tip near the sample. When the sample is irradiated by structured light, the probe tip will experience an optical force caused by the sample's chirality. By measuring this force, the chiral characteristics of the sample can be inferred. 3. **Distinguishing between transverse and longitudinal chirality**: By using circularly polarized light (CP) and the combination of radially/azimuthally polarized light beams respectively, the transverse and longitudinal chiral components of the sample can be probed respectively. Circularly polarized light can probe the transverse chiral component, while the combination of radially and azimuthally polarized light beams can probe the longitudinal chiral component. The advantage of this technique lies in its high spatial resolution (sub - 100 - nanometer scale) and its ability to provide detailed structural information on the nanoscale, which is of great significance for fields such as drug development and biomedical research.

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