Dielectric Properties of Metal-Organic Frameworks Probed via Synchrotron Infrared Reflectivity

Matthew R. Ryder,Zhixin Zeng,Yueting Sun,Irina Flyagina,Kirill Titov,E.M. Mahdi,Thomas D. Bennett,Bartolomeo Civalleri,Chris S. Kelley,Mark D. Frogley,Gianfelice Cinque,Jin-Chong Tan

DOI: https://doi.org/10.48550/arXiv.1802.06702

2018-02-20

Abstract:We present the frequency-dependant (dynamic) dielectric response of a group of topical polycrystalline zeolitic imidazolate-based metal-organic framework (MOF) materials in the extended infrared spectral region. Using synchrotron-based FTIR spectroscopy in specular reflectance, in conjunction with density functional theory (DFT) calculations, we have revealed detailed structure-property trends linking the THz region dielectric response to framework porosity and structural density. The work demonstrates that MOFs are promising candidate materials not only for low-\k{appa} electronics applications but could also be pioneering for terahertz (THz) applications, such as next-generation broadband communications technologies.

Materials Science

What problem does this paper attempt to address?

This paper attempts to address the problem of the dynamic dielectric response characteristics of metal - organic framework materials (MOFs) in the infrared (IR) and terahertz (THz) frequency ranges. Specifically, the main research questions include:

1. **Frequency - dependence of dielectric properties**: For the first time, the dynamic dielectric constants and refractive indices of five typical polycrystalline ZIF materials (ZIF - 4, ZIF - 7, ZIF - 8, ZIF - 71, and ZIF - 90) in the extended infrared spectral region (65 - 9000 cm\(^{-1}\)) were obtained by synchrotron - based FTIR spectroscopy.

2. **Relationship between structure and performance**: The detailed relationship between the dielectric response of these materials in the THz region and their framework porosity and structural density was revealed. The research shows that MOFs are not only candidate materials for low - \(\kappa\) electronic applications, but also have potential value in THz applications such as next - generation broadband communication technologies and optical sensors.

3. **Improvement of experimental methods**: The deficiencies of current experimental methods in studying the dielectric properties of these materials, especially in the IR and THz frequency bands, were addressed. By using synchrotron sources and Kramers - Kronig transform (KKT), researchers were able to obtain reflection spectra with a high signal - to - noise ratio and extract the complex dielectric constant from them.

4. **Effect of pressure on dielectric constant**: The effect of compression molding pressure on the dielectric constant of ZIF - 8 material was studied. It was found that the pressure has a particularly significant effect on the dielectric constant in the THz / far - infrared region, and this effect is mainly attributed to the structural response to pressure and the increase in particle compaction.

In summary, this paper aims to fill the gap in the study of the dielectric properties of MOFs in the IR and THz frequency bands, providing theoretical and technical support for the future development of new low - \(\kappa\) dielectric materials and their integration into microelectronic devices.