Reflectance dependence of polytetrafluoroethylene on thickness for xenon scintillation light

Jonathan Haefner,Alissa Neff,Maris Arthurs,Elizabeth Batista,Daniel Morton,Matt Okunawo,Kirill Pushkin,Aaron Sander,Scott Stephenson,Yuhan Wang,Wolfgang Lorenzon

DOI: https://doi.org/10.1016/j.nima.2017.01.057

2017-03-28

Abstract:Many rare event searches including dark matter direct detection and neutrinoless double beta decay experiments take advantage of the high VUV reflective surfaces made from polytetrafluoroethylene (PTFE) reflector materials to achieve high light collection efficiency in their detectors. As the detectors have grown in size over the past decade, there has also been an increased need for ever thinner detector walls without significant loss in reflectance to reduce dead volumes around active noble liquids, outgassing, and potential backgrounds. We report on the experimental results to measure the dependence of the reflectance on thickness of two PTFE samples at wavelengths near 178 nm. No change in reflectance was observed as the thickness of a cylindrically shaped PTFE vessel immersed in liquid xenon was varied between 1 mm and 9.5 mm.

Instrumentation and Detectors