Abstract:An electro-mechanical setup for the measurement of AC-forces in a low-temperature tunnelling microscope has been developed, which enables extremely high force resolution. The crosstalk of vibrations onto the tunnelling current is used to measure the deflection of a force-sensing cantilever beam. We demonstrate its capability to measure the noise of the force at a tunnelling contact using polycrystalline Iridium. Depending on temperature, spring constant and current, a resolution in the range of $\rm {fN}/\sqrt{\rm Hz}$ is possible. We observe peak levels of the force-noise at the energy of the expected phonon maximal density of states, which suggests that inelastic transport processes contribute to force fluctuations.

What problem does this paper attempt to address?

The problem that this paper attempts to solve is to develop an electromechanical device for measuring AC force in a low - temperature tunneling microscope in order to achieve extremely high force resolution. Specifically, the author measures the force noise at the tunneling contact by studying the influence of the vibration of the tunneling current on the deflection of the force - sensing cantilever. The main problems in this research include: 1. **Improving the resolution of force measurement**: By using polycrystalline iridium materials, researchers hope to achieve force resolution at the fN/√Hz level under different temperature, spring constant and current conditions. 2. **Exploring the sources of force noise**: In particular, the peak level of force noise observed at different temperatures coincides with the expected phonon maximum density of states energy, indicating that inelastic transport processes contribute to force fluctuations. 3. **Exploring the mechanism of force fluctuations caused by tunneling current**: Researchers hope to obtain information about the charge transport mechanism and its interaction with the environment by simultaneously measuring the force and charge current caused by the tunneling current. ### Main research content - **Experimental design**: An electromechanical device capable of measuring AC force in a low - temperature tunneling microscope was developed, which can detect crosstalk of the force exerted by tunneling electrons in the tunneling current. - **Data processing**: By carefully calibrating the crosstalk signal from cantilever deflection to tunneling current, researchers showed how to simplify the measurement setup and avoid using complex circuits or phase - locked loop circuits. - **Discussion of physical mechanisms**: The article discusses the relationship between force fluctuations and electron transport, especially how these fluctuations carry information about the correlation and interaction mechanisms of tunneling electrons. ### Research significance This research provides a new perspective for understanding the charge transport mechanism in nanosystems, especially the complex interaction between force fluctuations and electron transport in non - equilibrium states. In addition, the research results also have important implications for the failure mechanism of nano - electronic circuits. ### Formula summary The key formulas involved in the article are as follows: - The relationship between the force - noise power - spectral density $ S_F(\omega) $ and the mean - square displacement $ \langle z_c^2 \rangle $ of the cantilever: \[ S_F(\omega) = \frac{4 k_B T}{\omega_0 Q} \left( \frac{\partial I}{\partial z} \right)^2 \] where $ k_B $ is the Boltzmann constant, $ T $ is the temperature, $ \omega_0 $ is the angular frequency, $ Q $ is the quality factor, and $ \frac{\partial I}{\partial z} $ is the DC tunneling - current gradient in the vertical direction. Through these studies, the author shows how to use the crosstalk effect of the tunneling current to achieve high - resolution force measurement and reveals the relationship between force noise and material properties.

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