Automated Exposures Selection for High Dynamic Range Structured-Light 3-D Scanning

Wenyuan Chen,Xingjian Liu,Changhai Ru,Yu Sun
DOI: https://doi.org/10.1109/tie.2022.3201318
IF: 7.7
2023-02-22
IEEE Transactions on Industrial Electronics
Abstract:Structured light scanning has gained widespread applications in industrial metrology; however, measuring objects that have large surface-reflectivity variations is challenging. For this purpose, the high dynamic range (HDR) technique has become a standard method to fuse features under multiple exposures. Presently, in HDR measurement, manual or cumbersome exposure selection strategies are used. This article reports a new exposure selection approach. An image quality metric is designed to evaluate captured images and suppress regional overexposure, based on which a multiple-exposures selection strategy is developed. Unlike existing methods for single-optimal exposure selection, in our approach, pixel filtering is introduced to locate eligible pixels and candidate pixels in next exposures. Experimental results with industrial parts having large surface-reflectivity variations demonstrated that compared with HDR with 15 exposures (equal time intervals), our proposed approach achieved a similar surface coverage rates (97.4% versus 98.1%) and measurement accuracy (0.043 versus 0.041 mm), but only took 3–4 exposures averagely.
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