Pablo Rivero,Cedric M. Horvath,Zhen Zhu,Jie Guan,David Tománek,Salvador Barraza-Lopez
Abstract:Elemental phosphorous is believed to have several stable allotropes that are energetically nearly degenerate, but chemically reactive. To prevent chemical degradation under ambient conditions, these structures may be capped by monolayers of hexagonal boron nitride ({\em h}-BN) or graphene. We perform {\em ab initio} density functional calculations to simulate scanning tunneling microscopy (STM) images of different layered allotropes of phosphorus and study the effect of capping layers on these images. We find that protective monolayers of insulating {\em h}-BN allow to distinguish between the different structural phases of phosphorus underneath, even though the images are filtered through only nitrogen atoms that appear transparent. No such distinction is possible for phosphorus films capped by semimetallic graphene that masks the underlying structure. Our results suggest that the real-space imaging capability of STM is not hindered by selected capping layers that protect phosphorus surfaces.
What problem does this paper attempt to address?
The problem that this paper attempts to solve is: How to distinguish few - layer phosphorene of different structural phases under the coverage of monolayer hexagonal boron nitride (h - BN) or graphene through scanning tunneling microscope (STM) imaging technology. Specifically, the research aims to explore whether STM can effectively distinguish different allotropes of phosphorus and reveal its underlying structural features in the presence of these protective monolayer materials.
### Problem Background
Phosphorus has multiple stable allotropes, which are nearly degenerate in energy but chemically reactive. To prevent these phosphorus structures from chemically degrading under environmental conditions, they can be covered by monolayer hexagonal boron nitride (h - BN) or graphene. However, this coverage may interfere with the direct observation of phosphorus structures by STM. Therefore, the key to the research is to determine whether STM can still effectively identify and distinguish different allotropes of phosphorus in the presence of these protective layers.
### Research Objectives
1. **Simulate STM Images**: Simulate STM images of different - layer phosphorus through ab - initio density functional theory (DFT) calculations.
2. **Evaluate the Influence of Protective Layers**: Study the influence of h - BN and graphene as protective layers on STM images, especially whether these protective layers allow the distinction of different structural phases of phosphorus.
3. **Explore Electron Hybridization**: Analyze the hybridization effect of electron states between phosphorus and protective layers, and the influence of this hybridization on STM images.
### Main Findings
- **Effectiveness of h - BN**: The h - BN monolayer can make different structural phases of phosphorus show in STM images through electron hybridization with the outermost phosphorus atomic orbitals. This indicates that h - BN is a potential protective layer and can distinguish different allotropes of few - layer phosphorus in local probe experiments.
- **Limitations of Graphene**: In contrast, due to its relatively large non - zero electron density, the graphene monolayer may mask the features of phosphorus structures, making it difficult for STM to clearly identify different phases of phosphorus.
### Conclusions
Through this research, the authors have demonstrated that the h - BN monolayer can effectively distinguish different allotropes of phosphorus in STM imaging, while the graphene monolayer may not be suitable for this purpose. These results provide important guidance for future research, especially in the development of applications of phosphorus - based two - dimensional materials.
### Related Formulas
- The expression for STM current density:
\[
j(r, V_{\text{bias}}) \propto \rho_{\text{STM}}(r, V_{\text{bias}})
\]
where,
\[
\rho_{\text{STM}}(r, V_{\text{bias}}) = \int_{E_F - eV_{\text{bias}}}^{E_F} dE \rho(r, E)
\]
and
\[
\rho(r, E) = \sum_{n,k} |\psi_{nk}(r)|^2 \delta(E_{n,k} - E)
\]
These formulas describe the basic principle of STM imaging, that is, obtaining the electron density of states on the sample surface by measuring the tunneling current.