Abstract:We develop two inverse scattering schemes for locating multiple electromagnetic (EM) scatterers by the electric far-field measurement corresponding to a single incident/detecting plane wave. The first scheme is for locating scatterers of small size compared to the wavelength of the detecting plane wave. The multiple scatterers could be extremely general with an unknown number of components, and each scatterer component could be either an impenetrable perfectly conducting obstacle or a penetrable inhomogeneous medium with an unknown content. The second scheme is for locating multiple perfectly conducting obstacles of regular size compared to the detecting EM wavelength. The number of the obstacle components is not required to be known in advance, but the shape of each component must be from a certain known admissible class. The admissible class may consist of multiple different reference obstacles. The second scheme could also be extended to include the medium components if a certain generic condition is satisfied. Both schemes are based on some novel indicator functions whose indicating behaviors could be used to locate the scatterers. No inversion will be involved in calculating the indicator functions, and the proposed methods are every efficient and robust to noise. Rigorous mathematical justifications are provided and extensive numerical experiments are conducted to illustrate the effectiveness of the imaging schemes.
What problem does this paper attempt to address?
The problem that this paper aims to solve is to locate multiple electromagnetic scatterers through a single electrical far - field measurement. Specifically, the author proposes two single - measurement methods to solve the inverse scattering problem:
1. **Location of small - sized scatterers**: The first method is suitable for locating multiple electromagnetic scatterers that are small in size compared to the wavelength of the detected plane wave. These scatterers can be very general, containing an unknown number of components, and each component can be an impenetrable perfect - conducting obstacle or a penetrable inhomogeneous medium with unknown content. This method is based on a new indicator function, and the scatterers are located through the behavior of this function.
2. **Location of regular - sized conducting obstacles**: The second method is suitable for locating multiple perfect - conducting obstacles that are of a comparable size to the wavelength of the detected electromagnetic wave. In this case, the shape of each component must belong to a certain known acceptable category. This method is also based on a series of indicator functions, and these functions can be used to locate the scatterers through their behavior.
### Main contributions
- **Single measurement**: Both of these methods require only one electrical far - field measurement, which is very useful in practical applications because multiple measurements may increase the experimental complexity and cost.
- **Robustness**: The proposed methods are highly robust to noise and are computationally efficient.
- **Theoretical verification**: Rigorous mathematical proofs are provided, and the effectiveness of the methods is verified through extensive numerical experiments.
### Mathematical framework
- **Maxwell's equations**: The propagation of electromagnetic waves is described by Maxwell's equations, which have different forms inside and outside the scatterers.
- **Far - field pattern**: The far - field pattern \(A(\theta; \theta', p, \omega)\) of the scattered wave is the key observational data, where \(\theta\) is the far - field direction, \(\theta'\) is the incident direction, \(p\) is the polarization vector, and \(\omega\) is the frequency.
- **Indicator functions**: The two methods are based on different indicator functions \(I_s(z)\) and \(I_k^r(z)\) respectively. These functions are defined through inner - product operations and are used to identify the positions of the scatterers.
### Application background
The inverse scattering problem plays a crucial role in fields such as radar, sonar, non - destructive testing, remote sensing, geophysical exploration, and medical imaging. The single - measurement methods proposed in this paper have important practical application values in these fields, especially when the prior information is limited.