Fast Adapting Without Forgetting for Face Recognition

Hao Liu,Xiangyu Zhu,Zhen Lei,Dong Cao,Stan Z. Li

DOI: https://doi.org/10.1109/tcsvt.2020.3035890

IF: 5.859

2021-08-01

IEEE Transactions on Circuits and Systems for Video Technology

Abstract:Although face recognition has made dramatic improvements in recent years, there are still many challenges in real-world applications such as face recognition for the elderly and children, for the surveillance scenes and for Near infrared vs. Visible light (NIR-VIS) heterogeneous scene, etc. Due to the existence of these challenges, there are usually domain gaps between training (source domain) and test (target domain). A common way to improve the performance on the target domain is fine-tuning the base model trained on source domain using target data. However, it will severely degrade performance on the source domain. Another way which jointly trains models using both source and target data, suffers from the heavy computations and large data storage, especially when we continue to encounter new domains. In response to these problems, we introduce a new challenging task: Single Exemplar Domain Incremental Learning (SE-DIL), which utilizes the target domain data and just one exemplar per identity from source domain data to quickly improve the performance on the target domain while keeping the performance on the source domain. To deal with SE-DIL, we propose our Fast Adapting without Forgetting (FAwF) method with three components: margin-based exemplar selection, prototype-based class extension and hard&amp;soft knowledge distillation. Through FAwF, we can well maintain the source domain performance with only one sample per source domain class, greatly reducing the fine-tuning time-cost and data storage. Besides, we collected a large-scale children face dataset KidsFace with <span class="mjpage"><svg xmlns:xlink="http://www.w3.org/1999/xlink" width="4.391ex" height="2.176ex" style="vertical-align: -0.338ex;" viewBox="0 -791.3 1890.5 936.9" role="img" focusable="false" xmlns="http://www.w3.org/2000/svg"><g stroke="currentColor" fill="currentColor" stroke-width="0" transform="matrix(1 0 0 -1 0 0)"> <use xlink:href="#MJMAIN-31"></use> <use xlink:href="#MJMAIN-32" x="500" y="0"></use> <use xlink:href="#MJMATHI-4B" x="1001" y="0"></use></g></svg></span> identities for studying the SE-DIL in face recognition. Extensive analysis and experiments on our KidsFace-Test protocol and other challenging face test sets show that our method performs better than the state-of-the-art methods on both target and source domain.<svg xmlns="http://www.w3.org/2000/svg" style="display: none;"><defs id="MathJax_SVG_glyphs"><path stroke-width="1" id="MJMAIN-31" d="M213 578L200 573Q186 568 160 563T102 556H83V602H102Q149 604 189 617T245 641T273 663Q275 666 285 666Q294 666 302 660V361L303 61Q310 54 315 52T339 48T401 46H427V0H416Q395 3 257 3Q121 3 100 0H88V46H114Q136 46 152 46T177 47T193 50T201 52T207 57T213 61V578Z"></path><path stroke-width="1" id="MJMAIN-32" d="M109 429Q82 429 66 447T50 491Q50 562 103 614T235 666Q326 666 387 610T449 465Q449 422 429 383T381 315T301 241Q265 210 201 149L142 93L218 92Q375 92 385 97Q392 99 409 186V189H449V186Q448 183 436 95T421 3V0H50V19V31Q50 38 56 46T86 81Q115 113 136 137Q145 147 170 174T204 211T233 244T261 278T284 308T305 340T320 369T333 401T340 431T343 464Q343 527 309 573T212 619Q179 619 154 602T119 569T109 550Q109 549 114 549Q132 549 151 535T170 489Q170 464 154 447T109 429Z"></path><path stroke-width="1" id="MJMATHI-4B" d="M285 628Q285 635 228 637Q205 637 198 638T191 647Q191 649 193 661Q199 681 203 682Q205 683 214 683H219Q260 681 355 681Q389 681 418 681T463 682T483 682Q500 682 500 674Q500 669 497 660Q496 658 496 654T495 648T493 644T490 641T486 639T479 638T470 637T456 637Q416 636 405 634T387 623L306 305Q307 305 490 449T678 597Q692 611 692 620Q692 635 667 637Q651 637 651 648Q651 650 654 662T659 677Q662 682 676 682Q680 682 711 681T791 680Q814 680 839 681T869 682Q889 682 889 672Q889 650 881 642Q878 637 862 637Q787 632 726 586Q710 576 656 534T556 455L509 418L518 396Q527 374 546 329T581 244Q656 67 661 61Q663 59 666 57Q680 47 717 46H738Q744 38 744 37T741 19Q737 6 731 0H720Q680 3 625 3Q503 3 488 0H478Q472 6 472 9T474 27Q478 40 480 43T491 46H494Q544 46 544 71Q544 75 517 141T485 216L427 354L359 301L291 248L268 155Q245 63 245 58Q245 51 253 49T303 46H334Q340 37 340 35Q340 19 333 5Q328 0 317 0Q314 0 280 1T180 2Q118 2 85 2T49 1Q31 1 31 11Q31 13 34 25Q38 41 42 43T65 46Q92 46 125 49Q139 52 144 61Q147 65 216 339T285 628Z"></path></defs></svg>

engineering, electrical & electronic