Impact of Solar Activity on the Calculation of ToA Reflectance Values of Multispectral Images
Jonathan G. Müller,Alexander C. Vibrans,Cibele Teixeira Pinto
DOI: https://doi.org/10.1109/tgrs.2024.3364523
IF: 8.2
2024-02-27
IEEE Transactions on Geoscience and Remote Sensing
Abstract:Solar activity explains a fraction of the variation in incident solar irradiance at the top of atmosphere (ToA). The radiometric calibration of multispectral sensors depends on the exoatmospheric spectral irradiance (ESUN) parameter that quantifies the incidence of energy on the ToA in spectral intervals. Since ESUN values are normalized, they neglect the variability caused by this phenomenon. Therefore, we investigated the impact of the variability of the ToA solar irradiance caused by solar cycles and activities on the computation of the ToA reflectance values of the Enhanced Thematic Mapper Plus (ETM+)/L7 sensor using daily ToA solar irradiance data from the Spectral Irradiance Monitor (SIM)/Solar Radiation and Climate Experiment (SORCE) instrument. The relative variability in the time series of ToA reflectance was computed during solar cycles number 23 (partially) and 24 (2003–2020). The results indicate that short-term solar activity can affect daily ToA reflectance up to 0.46%, 0.40%, 0.31%, 0.22%, 0.35%, and 2.37% in the blue, green, red, near-infrared (NIR), shortwave infrared (SWIR)-1, and SWIR-2 bands of the ETM+ sensor, respectively. However, when compared to the upper limits of the long-term uncertainties of ~1.0% (visible (VIS)-NIR), ~1.2% (SWIR-1), and ~1.4% (SWIR-2), it appears that only the larger variations can be considered as due to the Sun's activity. The intrinsic long-term variations of the solar cycle are below these limits and may be influenced by the uncertainties of the instruments used. We conclude that solar activity is not negligible within radiometric calibration of multispectral sensors, but more accurate ToA solar irradiance data are needed to assess the impact of long-term phenomena.
imaging science & photographic technology,remote sensing,engineering, electrical & electronic,geochemistry & geophysics