Optimizing fault tolerance of RAM cell through MUX based modeling and design using symmetries of QCA cells

Syed Farah Naz,Suhaib Ahmed,Shafqat Nabi Mughal,Mohammed Asger,Jadav Chandra Das,Saurav Mallik,Mohd Asif Shah

DOI: https://doi.org/10.1038/s41598-024-59185-2

IF: 4.6

2024-04-15

Scientific Reports

Abstract:Extensive research is now being conducted on the design and construction of logic circuits utilizing quantum-dot cellular automata (QCA) technology. This area of study is of great interest due to the inherent advantages it offers, such as its compact size, high speed, low power dissipation, and enhanced switching frequency in the nanoscale domain. This work presents a design of a highly efficient RAM cell in QCA, utilizing a combination of a 3-input and 5-input Majority Voter (MV) gate, together with a 2 × 1 Multiplexer (MUX). The proposed design is also investigated for various faults such as single cell deletion, single cell addition and single cell displacement or misalignment defects. The circuit under consideration has a high degree of fault tolerance. The functionality of the suggested design is showcased and verified through the utilization of the QCADesigner tool. Based on the observed performance correlation, it is evident that the proposed design demonstrates effectiveness in terms of cell count, area, and latency. Furthermore, it achieves a notable improvement of up to 76.72% compared to the present configuration in terms of quantum cost. The analysis of energy dissipation, conducted using the QCAPro tool, is also shown for various scenarios. It is seen that this design exhibits the lowest energy dispersion, hence enabling the development of ultra-low power designs for diverse microprocessors and microcontrollers.

multidisciplinary sciences

What problem does this paper attempt to address?

The problem that this paper attempts to solve is to design an efficient and fault - tolerant random - access memory (RAM) cell based on quantum - dot cellular automata (QCA) technology. Specifically, the paper proposes a RAM cell design using 3 - input and 5 - input majority voter (MV) gates and 2 × 1 multiplexers (MUX). This design aims to optimize the following aspects:

1. **Reduce the number of cells**: Achieve the function of the RAM cell by using fewer QCA cells, thereby reducing the complexity and cost of the overall design.
2. **Reduce the area**: Optimize the design to reduce the required physical area, which is especially important for nano - scale circuit design.
3. **Reduce the latency**: Increase the data read - write speed and reduce the operation latency.
4. **Improve fault - tolerance**: Analyze and test fault conditions such as single - cell deletion, addition, and displacement to ensure that the design has high fault - tolerance performance in practical applications.
5. **Reduce energy consumption**: Through optimized design and simulation analysis, ensure that the RAM cell has low energy loss during operation, which is suitable for low - power applications.

The paper verifies the functionality of the design using the QCADesigner tool and analyzes the energy dissipation in different scenarios using the QCAPro tool. The results show that the proposed RAM cell design outperforms existing design schemes in multiple performance indicators, especially in terms of quantum cost, which can be reduced by up to 76.72%. In addition, the design exhibits fault - tolerance rates of 91.3% and 80.55% in the cases of single - cell deletion and addition defects, respectively. These improvements make the design particularly suitable for applications in low - power microprocessors and microcontrollers.