Calibration method for complex permittivity measurements using s-SNOM combining multiple probe tapping harmonics

Dario Siebenkotten,Bernd Kästner,Manuel Marschall,Arne Hoehl,Shuhei Amakawa

DOI: https://doi.org/10.1364/oe.523785

IF: 3.8

2024-06-15

Optics Express

Abstract:Dario Siebenkotten, Bernd Kästner, Manuel Marschall, Arne Hoehl, Shuhei Amakawa Scattering-type scanning near-field optical microscopy (s-SNOM) enables sub-diffraction spectroscopy, featuring high sensitivity to small ... [Opt. Express 32, 23882-23893 (2024)]

optics