Advanced Detection of Document Tampering Using Structural Similarity Index and Image Analysis Techniques

Prof. Divya Pandey,Prof. Zeba Vishwakarma,Prof. Mallika Dwivedi,Jatin Pasi,Shambhavi Pandey
DOI: https://doi.org/10.15680/ijmrset.2023.0604035
2023-11-25
Abstract:This research focuses on the application of the Structural Similarity Index (SSIM) technique for detecting tampering in various identity documents, such as PAN cards, Aadhar cards, and voter IDs. The SSIM method is employed to assess the structural similarity between the original and provided document images. Additionally, grayscale conversion and thresholding techniques are utilized to analyze shapes and contours, further aiding in the identification of tampered areas. Experimental results show that a low SSIM score indicates potential tampering in the provided image. Visualizations, including contour overlays, difference maps, and threshold-based comparisons, enhance the clarity of differences between original and tampered document images.
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