Comprehensive Characterization of Porous Transport Electrodes with SEM, XPS, and Tof-SIMS

Genevieve Stelmacovich,Lonneke van Eijk,Jayson Foster,Michael Walker,Lei Ding,Feng Yuan Zhang,Adam Paxson,Svitlana Pylypenko
DOI: https://doi.org/10.1149/ma2024-01341673mtgabs
2024-08-09
ECS Meeting Abstracts
Abstract:Advancements towards more efficient design and manufacturability of polymer electrolyte membrane electrolyzers include recent efforts to better integrate the porous transport layer (PTL) and adjacent anodic catalyst layer (CL), forming the porous transport electrode (PTE). It is well known that characterizations of the PTL alone, especially when combined with a protective coating, present numerous challenges. The PTE structure is even more complex, and it is difficult to comprehensively characterize all components and interfaces. In prior work, we established Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) as a characterization technique for the PTLs coated with protective coatings. This work demonstrates ToF-SIMS as a powerful technique for the characterization of PTLs integrated with CLs. A series of sintered Ti PTLs were first coated with protective Pt coatings and then coated with various IrO x and IrRuO x catalysts via electrodeposition. Prepared PTE samples ranged in catalyst loadings and catalyst composition. Selected samples were also subjected to annealing post-treatments to further modify catalyst composition. X-ray photoelectron spectroscopy (XPS) was conducted to identify surface chemical speciation and states of the catalysts. ToF-SIMS analysis was conducted using Cs in both positive and negative modes to identify chemical species, including Ir, Ru, and their oxides as a function of catalyst layer depth. These two methods were complemented by Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy (SEM- EDS) analysis to evaluate morphology and distribution of catalysts. This comprehensive physical and chemical characterization of the PTEs provides insights that are useful for the characterization of as produced, modified, and degraded PTE samples.
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