Effective Sample Selection and Enhancement of Long Short-Term Dependencies in Signal Detection: HDC-Inception and Hybrid CE Loss

Yingbin Wang,Weiwei Wang,Yuexin Chen,Xinyu Su,Jinming Chen,Wenhai Yang,Qiyue Li,Chongdi Duan
DOI: https://doi.org/10.3390/electronics13163194
IF: 2.9
2024-08-13
Electronics
Abstract:Signal detection and classification tasks, especially in the realm of audio, suffer from difficulties in capturing long short-term dependencies and effectively utilizing samples. Firstly, audio signal detection and classification need to classify audio signals and detect their onset and offset times; therefore, obtaining long short-term dependencies is necessary. The methods based on RNNs have high time complexity and dilated convolution-based methods suffer from the "gridding issue" challenge; thus, the HDC-Inception module is proposed to efficiently extract long short-term dependencies. Combining the advantages of the Inception module and a hybrid dilated convolution (HDC) framework, the HDC-Inception module can both alleviate the "gridding issue" and obtain long short-term dependencies. Secondly, datasets have large numbers of silent segments and too many samples for some signal types, which are redundant and less difficult to detect, and, therefore, should not be overly prioritized. Thus, selecting effective samples and guiding the training based on them is of great importance. Inspired by support vector machine (SVM), combining soft margin SVM and cross-entropy loss (CE loss), the soft margin CE loss is proposed. Soft margin CE loss can adaptively select support vectors (effective samples) in datasets and guide training based on the selected samples. To utilize datasets more sufficiently, a hybrid CE loss is proposed. Using the benefits of soft margin CE loss and CE loss, hybrid CE loss guides the training with all samples and gives weight to support vectors. Soft margin CE loss and hybrid CE loss can be extended to most classification tasks and offer a wide range of applications and great potential.
engineering, electrical & electronic,computer science, information systems,physics, applied
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