Novel Application of Silicon Multivacancy Satellite Peaks for Silicate Minerals Analysis in Igneous Rocks Using WD-XRF Coupled with Chemometrics Analysis

Ashok Kumar Maurya
DOI: https://doi.org/10.1039/d4ja00199k
2024-09-02
Journal of Analytical Atomic Spectrometry
Abstract:X-ray spectra are pivotal for understanding chemical bonding and atomic interactions in materials. Particularly, valence-to-core (VtC) electronic transitions and satellite peaks within X-ray spectra provide insights into valence states and chemical environments. This study focuses on the multivacancy satellite peaks, Si KβIII and KβIV, and their application in analyzing silicate minerals in igneous rocks. A wavelength dispersive X-ray fluorescence (WD-XRF) spectrometer, commonly employed for chemical analysis of geological samples, was utilized in this study. The Si KβIII and KβIV peaks were selected due to their VtC transitions and multivacancy origin, offering enhanced sensitivity to the chemical environment. We examined 41 certified reference materials (CRMs) of igneous rocks, demonstrating the capability of these satellite peaks to reveal detailed chemical and structural information. A strong correlation was found between the chemical composition of silicate minerals and the intensities and chemical shifts of the Si KβIII and KβIV peaks. We developed a regression model to predict mineral concentrations, validating the method with CRMs. The results suggest that the spectral region of the Si KβIII and KβIV peaks serves as a distinctive fingerprint for identifying silicate minerals in igneous rocks. This approach provides an additional, accurate and a rapid tool for mineral characterization in geological samples.
spectroscopy,chemistry, analytical
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