Abstract:In practical applications, some random variables follow multimodal distributions . However, conventional reliability analysis methods in reliability-based topology optimization (RBTO), such as the first order reliability method , often result in considerable computational errors when dealing with problems involving multimodal distributions. Consequently, the corresponding RBTO design is incredible. Moreover, the RBTO problem also faces the challenge of high computational cost. To this end, this paper proposes an efficient two-phase approach for RBTO of continuum structures with multimodal distributions combining sequential approximate integer programming with trust region (SAIP-TR) and direct probability integral method (DPIM). Firstly, DPIM is advanced to address the difficult problems of failure probability estimation and efficient sensitivity analysis under multimodal distributions. Secondly, a reliability-based discrete variable topology optimization framework based on SAIP-TR and DPIM is established, which yields clear topology configurations and facilitates engineering manufacturing . Owing to the merit of SAIP-TR, the original RBTO process is divided into two phases: the first phase performs deterministic topology optimization, and the second phase focuses on RBTO. Moreover, an adaptive selection strategy of representative points, considering structural compliance as performance function, is devised to further enhance computational efficiency. Finally, several examples illustrate high efficiency and accuracy of the proposed approach. The multimodal random variable and the random field are employed separately to describe global and local uncertainties in materials. In contrast, the optimized result considering global material uncertainty is more suitable for additive manufacturing. The proposed approach also presents potential in handling complex RBTO problems with random fields.

Reliability-based topology optimization under random-field material model

Robust reliability-based topology optimization under random-field material model

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