Soft X-ray emissions of Si IX in Procyon

Guiyun Liang,Gang Zhao

DOI: https://doi.org/10.1016/j.newast.2007.01.001

IF: 2.096

2007-08-01

New Astronomy

Abstract:A detailed analysis of emission lines of carbon-like silicon reveals that some ratios of n=3→2 line intensities are sensitive to the electron density, ne. The ratio between two groups of 3d→2p transition lines of 55.246Å and 55.346Å provides a good diagnostic of ne because of the combined characteristic of sensitivity to electron density and relative insensitivity to temperature. From this ratio, a lower limit of the electron density of 0.6×108cm−3 was set for Procyon, which is consistent with the values constrained by C V and Si X emission lines. Significant discrepancies were found between theoretical predictions and observations for the 3s→2p lines relative to 3d→2p lines in Procyon, recently measured using the Chandra high-resolution transmission grating instrument. The difference of more than a factor of 3, cannot be explained by uncertainties of atomic data. Ness and co-workers also suggested that the effect of opacity appeared not to be a major factor for the discrepancy. For the 3s→2p line at 61.611Å, present work indicates that the large discrepancy may be from the contamination of a S VIII line at 61.645Å. For lines at 61.702 and 61.846Å, we suggest that the discrepancies may be attributed to contaminations by currently yet-unknown spectral lines.

astronomy & astrophysics