UFCC: A Unified Forensic Approach to Locating Tampered Areas in Still Images and Detecting Deepfake Videos by Evaluating Content Consistency

Po-Chyi Su,Bo-Hong Huang,Tien-Ying Kuo
DOI: https://doi.org/10.3390/electronics13040804
IF: 2.9
2024-02-20
Electronics
Abstract:Image inpainting and Deepfake techniques have the potential to drastically alter the meaning of visual content, posing a serious threat to the integrity of both images and videos. Addressing this challenge requires the development of effective methods to verify the authenticity of investigated visual data. This research introduces UFCC (Unified Forensic Scheme by Content Consistency), a novel forensic approach based on deep learning. UFCC can identify tampered areas in images and detect Deepfake videos by examining content consistency, assuming that manipulations can create dissimilarity between tampered and intact portions of visual data. The term "Unified" signifies that the same methodology is applicable to both still images and videos. Recognizing the challenge of collecting a diverse dataset for supervised learning due to various tampering methods, we overcome this limitation by incorporating information from original or unaltered content in the training process rather than relying solely on tampered data. A neural network for feature extraction is trained to classify imagery patches, and a Siamese network measures the similarity between pairs of patches. For still images, tampered areas are identified as patches that deviate from the majority of the investigated image. In the case of Deepfake video detection, the proposed scheme involves locating facial regions and determining authenticity by comparing facial region similarity across consecutive frames. Extensive testing is conducted on publicly available image forensic datasets and Deepfake datasets with various manipulation operations. The experimental results highlight the superior accuracy and stability of the UFCC scheme compared to existing methods.
engineering, electrical & electronic,computer science, information systems,physics, applied
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