High Mass Resolution Multireflection Time-of-Flight Secondary Ion Mass Spectrometer
Jichun Jiang,Lei Hua,Yuanyuan Xie,Yixue Cao,Yuxuan Wen,Ping Chen,Haiyang Li
DOI: https://doi.org/10.1021/jasms.1c00016
IF: 3.262
2021-04-20
Journal of the American Society for Mass Spectrometry
Abstract:Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is popular because of its advantages of parallel <i>m</i>/<i>z</i> detection and less damage for unknown or rare samples compared to sector field instruments. However, the mass resolving power of conventional TOF-SIMS is limited by its relati …
chemistry, physical,spectroscopy, analytical,biochemical research methods