High-Efficiency and Stable Inverted Planar Perovskite Solar Cells with Pulsed Laser Deposited Cu-Doped NiO x Hole-Transport Layers

Menglei Feng,Ming Wang,Hongpeng Zhou,Wei Li,Shuangpeng Wang,Zhigang Zang,Shijian Chen
DOI: https://doi.org/10.1021/acsami.0c15923
2020-10-29
Abstract:High-quality hole-transport layers (HTLs) with excellent optical and electrical properties play a significant role in achieving high-efficient and stable inverted planar perovskite solar cells (PSCs). In this work, the optoelectronic properties of Cu-doped NiO<sub><i>x</i></sub> (Cu:NiO<sub><i>x</i></sub>) films and the photovoltaic performance of PSCs with Cu:NiO<sub><i>x</i></sub> HTLs were systematically studied. The Cu-doped NiO<sub><i>x</i></sub> with different doping concentrations was achieved by a high-temperature solid-state reaction, and Cu:NiO<sub><i>x</i></sub> films were prepared by pulsed laser deposition (PLD). Cu<sup>+</sup> ion dopants not only occupy the Ni vacancy sites to improve the crystallization quality and increase the hole mobility, but also substitute lattice Ni<sup>2+</sup> sites and act as acceptors to enhance the hole concentration. As compared to the undoped NiO<sub><i>x</i></sub> films, the Cu:NiO<sub><i>x</i></sub> films exhibit a higher electrical conductivity with a faster charge transportation and extraction for PSCs. By employing the prepared Cu:NiO<sub><i>x</i></sub> films as HTLs for the PSCs, a high photocurrent density of 23.17 mA/cm<sup>2</sup> and a high power conversion efficiency of 20.41% are obtained, which are superior to those with physical vapor deposited NiO<sub><i>x</i></sub> HTLs. Meanwhile, the PSC devices show a negligible hysteresis behavior and a long-term air-stability, even without any encapsulation. The results demonstrate that pulsed laser deposited Cu-doped NiO<sub><i>x</i></sub> film is a promising HTL for realizing high-performance and air-stable PSCs.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acsami.0c15923?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acsami.0c15923</a>.Experimental section, device characterization, and DFT calculations; cross-section SEM images and EDS spectra, carrier concentration and mobility, C-AFM characteristics, XPS spectra, UPS spectra, and RMS values of Cu:NiO<sub><i>x</i></sub> films; and statistical distribution of PSC devices (<a class="ext-link" href="/doi/suppl/10.1021/acsami.0c15923/suppl_file/am0c15923_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.
materials science, multidisciplinary,nanoscience & nanotechnology
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