Improving optical thickness monitoring by including systematic and process-influenced transmittance deviations: publisher's note

Cristina Kapler

DOI: https://doi.org/10.1364/ao.537478

IF: 1.9

2024-07-26

Applied Optics

Abstract:Stefan Bruns, Philipp Farr, Thomas Melzig, Jorg Terhurne, Michael Vergohl This publisher's note reports corrections in Appl. Opt.62, B141 (2023)APOPAI0003-693510.1364/AO.475076. [Appl. Opt. 63, 5940-5940 (2024)]

optics

What problem does this paper attempt to address?

A-Si/SiO_2 nanolaminates for tuning the complex refractive index and band gap in optical interference coatings: publisher's note

Cristina Kapler

DOI: https://doi.org/10.1364/ao.537475

IF: 1.9

2024-07-26

Applied Optics

Abstract:Karl Kreuzer, Philipp Farr, Michael Vergohl, Stefan Bruns, Thomas Melzig, Christian Patzig, Rene Feder This publisher's note reports corrections in Appl. Opt.63, 1641 (2024)APOPAI0003-693510.1364/AO.515083. [Appl. Opt. 63, 5939-5939 (2024)]

optics
Notice of Retraction A study of support vector regression for surface characteristics in-process optical measurement

Ruipeng Guo,Zhengsu Tao

DOI: https://doi.org/10.1109/ICMEE.2010.5558495

2010-01-01

Abstract:Notice of Retraction After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE's Publication Principles. We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper. The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org. This paper aims to introduce a new model into surface characteristics in-process optical measurement in machining process. The opaque property of the coolants would be a problem for in-process measurement of workpiece surface characteristics using optical methods during grinding operations. A transparent window method that can produce an optically clean zone on the surface is employed to solve this problem. The surface scattered images of specimens in the clean zone are captured and some features are extracted from the images. A machine learning technique called support vector regression (SVR) is proposed to establish the relationship between these features, optical measurement system and surface roughness, and consequently determine surface roughness. Flow rate of the transparent fluid, the thickness of the fluid layer, scattering feature along the main direction of the scattering stripe, standard deviation perpendicular to the main direction of the scattering stripe and gray feature of the scattered image are supplied as input parameters to the SVR model and the surface roughness is predicted. Experiments have been carried out on some standard specimens with different surface roughness values, and the results show that the new model could estimate the surface roughness with an average percentage deviation of 0.6145%. Therefore, the SVR model is suitable for in-process optical measurement of surface characteristics with a satisfactory accuracy.
Precision of Retardance Autocalibration in Full-Stokes Division-of-focal-plane Imaging Polarimeters: Publisher's Note.

François Goudail,Xiaobo Li,Matthieu Boffety,Stéphane Roussel,Tiegen Liu,Haofeng Hu

DOI: https://doi.org/10.1364/ol.44.005759

2019-01-01

Abstract:This publisher's note contains corrections to Opt. Lett.44, 5410 (2019)OPLEDP0146-959210.1364/OL.44.005410.
Polarization-Sensitive Perfect Absorbers At Near-Infrared Wavelengths: Erratum (Vol 21, Pg A111, 2013)

Lijun Meng,Ding Zhao,Qiang Li,Min Qiu

DOI: https://doi.org/10.1364/OE.21.00A229

IF: 3.8

2013-01-01

Optics Express

Abstract:In the earlier paper [Opt. Express. 21, A111 (2013)], Fig. 6, Fig. 10, and Fig. 13 were improperly given. They are updated here, and the modifications do not significantly change the paper's findings. (c) 2013 Optical Society of America
Erratum: Thermal analysis of injectable, cellular scale optoelectronics with pulsed power (Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences …

Yuhang Li,Xiaoting Shi,Jizhou Song,Chaofeng Lü,Tae Il Kim,Jordan G McCall,Michael R Bruchas,John A Rogers,Yonggang Huang

2013-01-01

Abstract:In: Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, Vol. 469, No. 2157, 20130398, 08.09.2013 … Li, Yuhang ; Shi, Xiaoting ; Song, Jizhou ; Lü, Chaofeng ; Kim, Tae Il ; McCall, Jordan G. ; Bruchas, Michael R. ; Rogers, John A. ; Huang, Yonggang. / Erratum : Thermal analysis of injectable, cellular-scale optoelectronics with pulsed power (Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences (2013) 469 (20130142) DOI:10.1098/rspa.2013.0142). In: Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences. 2013 ; Vol. 469, No. 2157.
Optical parameters estimation in inhomogeneous turbid media using backscattered light: for transcutaneous scattering measurement of intravascular blood: erratum

Shiyang Liang,Takeo Miyake,Koichi Shimizu

DOI: https://doi.org/10.1364/boe.517856

IF: 3.4

2024-01-19

Biomedical Optics Express

Abstract:This erratum corrects several typographical errors in Eqs. (2), (8) and (10) of our paper [ Biomed. Opt. Express 15 ( 1 ), 237 ( 2024 ). 10.1364/BOE.510245 ].

radiology, nuclear medicine & medical imaging,biochemical research methods,optics
Erratum: Ultrathin conformal devices for precise and continuous thermal characterization of human skin

R. Chad Webb,Andrew P. Bonifas,Alex Behnaz,Yihui Zhang,Ki Jun Yu,Huanyu Cheng,Mingxing Shi,Zuguang Bian,Zhuangjian Liu,Yun-Soung Kim,Woon-Hong Yeo,Jae Suk Park,Jizhou Song,Yuhang Li,Yonggang Huang,Alexander M. Gorbach,John A. Rogers

DOI: https://doi.org/10.1038/nmat3779

IF: 41.2

2013-01-01

Nature Materials

Abstract:Nature Materials 12, 938–944 (2013); published online 15 September 2013; corrected after print 26 September 2013. In the version of this Article originally published, in Fig. 3b,c the labels at the top of the graphs were missing. This error has been corrected in the HTML and PDF versions of the Article.
Dynamic pressure surface deformation measurement based on a chromatic confocal sensor: erratum

Bin Zhao,Junyi Li,Xiaoxiao Mao,Fei Sun,Xiumin Gao

DOI: https://doi.org/10.1364/ao.517844

IF: 1.9

2024-02-21

Applied Optics

Abstract:Bin Zhao, Junyi Li, Xiaoxiao Mao, Fei Sun, Xiumin Gao This erratum corrects errors in Fig. 4 of the original paper, Appl. Opt.62, 1467 (2023)APOPAI0003-693510.1364/AO.482808. [Appl. Opt. 63, 1735-1735 (2024)]

optics
Author Correction: Ultra-thin high-efficiency mid-infraredtransmissive Huygens meta-optics

Li Zhang,Jun Ding,Hanyu Zheng,Sensong An,Hongtao Lin,Bowen Zheng,Qingyang Du,Gufan Yin,Jerome Michon,Yifei Zhang,Zhuoran Fang,Mikhail Y. Shalaginov,Longjiang Deng,Tian Gu,Hualiang Zhang,Juejun Hu

DOI: https://doi.org/10.1038/s41467-018-04890-6

IF: 16.6

2018-01-01

Nature Communications

Abstract:The original version of this Article omitted the following from the Acknowledgements:‘J.D. and H. Zhang acknowledge initial funding for design of the meta-atoms provided by the National Science Foundation under award CMMI-1266251. Z.L. and H. Zheng contributed to the Device Fabrication section and were independently funded as visiting scholars by the National Natural Science Foundation of China under award 51772042 and the “111” project (No. B13042) led by Professor Huaiwu Zhang. Later work contained within the Device Modeling and Device Characterization sections and some revisions to the manuscript were funded under Defense Advanced Research Projects Agency Defense Sciences Office (DSO) Program: EXTREME Optics and Imaging (EXTREME) under Agreement No. HR00111720029. The authors also acknowledge fabrication facility support by the Harvard University Center for Nanoscale Systems funded by the National Science Foundation under award 0335765. The views, opinions and/or findings expressed are those of the authors and should not be interpreted as representing the official views or policies of the Department of Defense or the U.S. Government.’ This has been corrected in both the PDF and HTML versions of the Article.
Optical feedback noise-immune cavity-enhanced optical heterodyne molecular spectrometry for sub-Doppler-broadened detection of C_2H_2: publisher's note

Xiaobin Zhou,Gang Zhao,Yong Li,Ziwei Cheng,Kang Jiao,Bofeng Zhang,Zihao Zhang,Yanke Li,Xiaojuan Yan,Weiguang Ma,Suotang Jia

DOI: https://doi.org/10.1364/ol.520001

IF: 3.6

2024-02-11

Optics Letters

Abstract:Xiaobin Zhou, Gang Zhao, Yong Li, Ziwei Cheng, Kang Jiao, Bofeng Zhang, Zihao Zhang, Yanke Li, Xiaojuan Yan, Weiguang Ma, Suotang Jia This publisher's note contains a correction to Opt. Lett.49, 202 (2024)10.1364/OL.507004. [Opt. Lett. 49, 956-956 (2024)]

optics
Thermal optical aberrations correction via postprocessing in a raw domain

Jiahui Xu,Zhengyue Zhuge,Wenguan Zhang,Hao Xu,Qiu Tianchen,Zhihai Xu,Qi Li,Yueting Chen

DOI: https://doi.org/10.1364/oe.543481

IF: 3.8

2024-12-12

Optics Express

Abstract:Jiahui Xu, Zhengyue Zhuge, Wenguan Zhang, Hao Xu, Tianchen Qiu, Zhihai Xu, Qi Li, Yueting Chen Optical imaging systems are susceptible to severe performance degradation when exposed to extreme temperature fluctuations. While extensive ... [Opt. Express 32, 46906-46918 (2024)]

optics
Modeling of Ultraviolet Scattering Propagation and Its Applicability Analysis: Erratum.

Zanqiu Shen,Jianshe Ma,Tao Shan,Tianfeng Wu

DOI: https://doi.org/10.1364/ol.44.005654

IF: 3.6

2019-01-01

Optics Letters

Abstract:This erratum provides corrections to Fig. 1, Eqs. (1b) and (6b), and Case (e) of Opt. Lett.44, 4953 (2019)OPLEDP0146-959210.1364/OL.44.004953.
Sensitivity Improvement by Optimized Optical Switching and Curve Fitting in a Cavity Ring-Down Spectrometer: Publisher’s Note

Weipeng Zhang,Haoyun Wei,Xinyi Chen,Yan Li

DOI: https://doi.org/10.1364/ao.399288

IF: 1.9

2020-01-01

Applied Optics

Abstract:This publisher’s note amends an award ID in the Funding section of Appl. Opt. 57, 8487 (2018)APOPAI0003-693510.1364/AO.57.008487.
Thermal, structural, and optical properties of Cleartran® multispectral zinc sulfide (Erratum)

Daniel C. Harris,Meghan Baronowski,Ladd Henneman,Len LaCroix,Clyde Wilson,Shelby Kurzius,Bob Burns,Keith Kitagawa,Jozef Gembarovic,Steven M. Goodrich,Christian Staats,John J. Mecholsky

DOI: https://doi.org/10.1117/1.oe.63.2.029801

IF: 1.3

2024-02-28

Optical Engineering

Abstract:Erratum corrects the sign of the coefficient in Eq. 5.

optics
Corrections to “zinc Oxide Nanostructures and High Electron Mobility Nanocomposite Thin Film Transistors” [nov 08 3001-3011

Fang‐Ze Li,Gen-Wen Hsieh,S. H. Dalal,Mary Newton,J.E. Stott,Pritesh Hiralal,Arokia Nathan,P. A. Warburton,Hüsnü Emrah Ünalan,Paul Beecher,Andrew J. Flewitt,Ian Robinson,G.A.J. Amaratunga,W. I. Milne

DOI: https://doi.org/10.1109/ted.2008.2010442

2009-01-01

Abstract:In our paper [F.M. Li et al., 2008], two errors were noticed after the paper went to press. On page 3002, near the middle of the left column, it should say "In this method, zinc oxide and carbon powders are mixed together, usually in a ZnO:C ratio of 1: 1 or 1:4 by weight." In Fig. 8, on page 3005, the x-axis label should say "energy (eV)" instead of "wavelength (eV)." Also, this paper should have been designated as Invited, as it is now above.
Comparison of quantitative defect characterization using pulse-phase and lock-in thermography: erratum

Rainer Krankenhagen,Mathias Röllig,Christiane Maierhofer

DOI: https://doi.org/10.1364/ao.545147

IF: 1.9

2024-11-01

Applied Optics

Abstract:Christiane Maierhofer, Mathias Röllig, Rainer Krankenhagen, Philipp Myrach Based on the results of a study on systematic errors in thermographic lock-in measurements [14th Quantitative Infrared Thermography ... [Appl. Opt. 63, 8295-8296 (2024)]

optics
High-resolution self-corrected single-pixel imaging through dynamic and complex scattering media: erratum

Lina Zhou,Yin Xiao,Wen Chen

DOI: https://doi.org/10.1364/oe.519851

IF: 3.8

2024-02-10

Optics Express

Abstract:Lina Zhou, Yin Xiao, Wen Chen We correct typographical errors in our paper [Opt. Express31, 23027 (2023)10.1364/OE.489808]. The corrections have no influence on the ... [Opt. Express 32, 6705-6705 (2024)]

optics
High-precision 3D imaging using spectral encoding based on the mode-locked optical frequency comb: publisher's note

Manxiang Xu,Qihua Liu,Jindong Wang,Xinghua Qu,Fumin Zhang

DOI: https://doi.org/10.1364/ao.544650

IF: 1.9

2024-10-18

Applied Optics

Abstract:Manxiang Xu, Qihua Liu, Jindong Wang, Xinghua Qu, Fumin Zhang This publisher's note reports corrections made to Appl. Opt.63, 7637 (2024)APOPAI0003-693510.1364/AO.537171. [Appl. Opt. 63, 8027-8027 (2024)]

optics
Continuous chirped-wave phase-sensitive optical time domain reflectometry: publisher’s note

Jialin Jiang,Zinan Wang,Zitan Wang,Zijie Qiu,Chunye Liu,Yunjiang Rao

DOI: https://doi.org/10.1364/ol.421628

IF: 3.6

2021-01-01

Optics Letters

Abstract:This publisher’s note contains corrections to Opt. Lett.46, 685 (2021)OPLEDP0146-959210.1364/OL.415087.
Schlieren Two-Photon Microscopy for Phase-Contrast Imaging: Publisher's Note.

Hao Xie,Yuanlong Zhang,Linjie Kong,Peng Xi,Qionghai Dai

DOI: https://doi.org/10.1364/ao.58.002137

IF: 1.9

2019-01-01

Applied Optics

Abstract:This publisher's note amends the page range in Appl. Opt.58, A26 (2019)APOPAI0003-693510.1364/AO.58.000A26.

Improving optical thickness monitoring by including systematic and process-influenced transmittance deviations: publisher's note

A-Si/SiO_2 nanolaminates for tuning the complex refractive index and band gap in optical interference coatings: publisher's note

Notice of Retraction A study of support vector regression for surface characteristics in-process optical measurement

Precision of Retardance Autocalibration in Full-Stokes Division-of-focal-plane Imaging Polarimeters: Publisher's Note.

Polarization-Sensitive Perfect Absorbers At Near-Infrared Wavelengths: Erratum (Vol 21, Pg A111, 2013)

Erratum: Thermal analysis of injectable, cellular scale optoelectronics with pulsed power (Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences …

Optical parameters estimation in inhomogeneous turbid media using backscattered light: for transcutaneous scattering measurement of intravascular blood: erratum

Erratum: Ultrathin conformal devices for precise and continuous thermal characterization of human skin

Dynamic pressure surface deformation measurement based on a chromatic confocal sensor: erratum

Author Correction: Ultra-thin high-efficiency mid-infraredtransmissive Huygens meta-optics

Optical feedback noise-immune cavity-enhanced optical heterodyne molecular spectrometry for sub-Doppler-broadened detection of C_2H_2: publisher's note

Thermal optical aberrations correction via postprocessing in a raw domain

Modeling of Ultraviolet Scattering Propagation and Its Applicability Analysis: Erratum.

Sensitivity Improvement by Optimized Optical Switching and Curve Fitting in a Cavity Ring-Down Spectrometer: Publisher’s Note

Thermal, structural, and optical properties of Cleartran® multispectral zinc sulfide (Erratum)

Corrections to “zinc Oxide Nanostructures and High Electron Mobility Nanocomposite Thin Film Transistors” [nov 08 3001-3011

Comparison of quantitative defect characterization using pulse-phase and lock-in thermography: erratum

High-resolution self-corrected single-pixel imaging through dynamic and complex scattering media: erratum

High-precision 3D imaging using spectral encoding based on the mode-locked optical frequency comb: publisher's note

Continuous chirped-wave phase-sensitive optical time domain reflectometry: publisher’s note

Schlieren Two-Photon Microscopy for Phase-Contrast Imaging: Publisher's Note.